Webinars

Characterization of Powders and Particles with Integrated AFM-in-SEM

Recorded webinar Understanding the physical properties of particles—such as surface roughness, adhesion, mechanical stiffness, and 3D morphology—is essential across industries from pharmaceuticals to metallurgy and...

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Extreme Testing: How In-situ Nanoindentation Pushes Metallurgy to the Limits

Thursday April 24th 10.00 CET This webinar explores the latest advancements in in-situ nanoindentation for metallurgy, steel, and metallic alloys. Key topics include fast mechanical...

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Advances in SEM-based nanoprobing - Electrical Fault Localization and Failure Analysis

Thursday April 10th 10.00 CET Learn how to perform electrical characterization on small structures using a high accuracy probing solution. Understand the various probing techniques...

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Argon Beam Ion Milling: Advanced Techniques for Cross Section Preparation

Recorded webinar Join this webinar to understand more about Broad Argon Ion Beam (BIB) milling as a precise, stress-free method for preparing high-quality SEM cross-sections...

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Short-Pulsed Laser Processing for Material Analysis

Recorded webinar Join us for an exciting webinar to explore how femto-second laser processing can revolutionize sample preparation for electron microscopy and atom probe tomography....

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From Cross Sections to Volume : In-situ Microtome for SEM

Watch this recorded webinar to learn more about volume microscopy and how Serial Block Face imaging (SBF-SEM) can be used to create 3D dataset of...

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Powering the Future: Unveiling Battery Electrode Secrets with AFM-in-SEM

Wednesday 22nd January 16.00 CET Join us for an insightful free webinar as we dive into the critical role of characterizing battery components—cathodes, anodes, electrolytes, and...

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Nanoindentation in extreme environments

2025-01-29, 9:00 Extreme Hi and Low temperature, over 8 orders of magnitude of strain rate and in nuclear environments Speakers: Dr Renato Pero & Dr....

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Intro to Image-Pro AI Deep Learning

Image-Pro® AI is a powerful image analysis software designed to enhance efficiency and accuracy in scientific research and quality inspection. Leveraging advanced AI Deep Learning...

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Cathodoluminescence fundamentals - Part 6: Correlative cathodoluminescence electron microscopy

In this final episode, we focus on how correlative cathodoluminescence electron microscopy or CCLEM. Sangeetha Hari, our applications specialist, will give more information on how...

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Cathodoluminescence fundamentals - Part 5: CL for semiconductors

In this session, we focus on how CL can contribute in research of semiconductors. Sangeetha Hari, our applications specialist, will give more information on the...

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Cathodoluminescence fundamentals - Part 4: CL for geological materials

In this session, we focus on how CL can be used to image geological materials. Sangeetha Hari, our applications specialist, will give more information on...

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Cathodoluminescence fundamentals - Part 3: Sample preparation for cathodoluminescence imaging

In this session, we are discussing an essential topic for CL imaging process: the sample preparation. Our applications specialist Sangeetha Hari introduces the importance of...

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Cathodoluminescence Fundamentals - Part 1 : CL processes

In this video, Sangeetha Hari explains the difference between coherent and incoherent CL emission, how it can be identified and what each type of emission...

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Cathodoluminescence fundamentals - Part 2 : Imaging conditions for CL

This session is dedicated to imaging conditions for cathodoluminescence. In this webinar, we introduce the effect of the SEM parameters on generating CL, and describe...

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Failure Analysis using in-SEM nanoprobing

This presentation on SEM-based nanoprobing applicaitons was contributed to the International SPM Symposium FAMT by Andrew Smith from Kleindiek.

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Powders and Particles, and 2D materials webinar

How to effectively measure and determine the surface roughness of powders and particles, as the surface roughness might strongly influence their behavior. We will discuss...

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AFM in SEM Redefining In Situ Correlative Analyses

What will you learn at the webinar? Introduction to AFM-in-SEM and In-Situ Correlative Microscopy: Learn about the benefits and applications of AFM-in-SEM for in-situ correlative...

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Introduction to LEIS - Low Energy Ion Scattering

An introduction to Low Energy Ion Scattering (LEIS) - a surface analytical technique to quantify the elemental composition of the outermost atomic layer.

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Introduction to TOF-SIMS

In this presentation Time-Of-Flight Secondary Ion Mass Spectroscopy (TOF-SIMS) is explained.

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Webinars

Webinars

Webinars

Characterization of Powders and Particles with Integrated AFM-in-SEM

Characterization of Powders and Particles with Integrated AFM-in-SEM

Characterization of Powders and Particles with Integrated AFM-in-SEM

Extreme Testing: How In-situ Nanoindentation Pushes Metallurgy to the Limits

Extreme Testing: How In-situ Nanoindentation Pushes Metallurgy to the Limits

Advances in SEM-based nanoprobing - Electrical Fault Localization and Failure Analysis

Advances in SEM-based nanoprobing - Electrical Fault Localization and Failure Analysis

Argon Beam Ion Milling: Advanced Techniques for Cross Section Preparation

Argon Beam Ion Milling: Advanced Techniques for Cross Section Preparation

Short-Pulsed Laser Processing for Material Analysis

Short-Pulsed Laser Processing for Material Analysis

From Cross Sections to Volume : In-situ Microtome for SEM

From Cross Sections to Volume : In-situ Microtome for SEM

Powering the Future: Unveiling Battery Electrode Secrets with AFM-in-SEM

Powering the Future: Unveiling Battery Electrode Secrets with AFM-in-SEM

Nanoindentation in extreme environments

Nanoindentation in extreme environments

Intro to Image-Pro AI Deep Learning

Intro to Image-Pro AI Deep Learning

Cathodoluminescence fundamentals - Part 6: Correlative cathodoluminescence electron microscopy

Cathodoluminescence fundamentals - Part 6: Correlative cathodoluminescence electron microscopy

Cathodoluminescence fundamentals - Part 5: CL for semiconductors

Cathodoluminescence fundamentals - Part 5: CL for semiconductors

Cathodoluminescence fundamentals - Part 4: CL for geological materials

Cathodoluminescence fundamentals - Part 4: CL for geological materials

Cathodoluminescence fundamentals - Part 3: Sample preparation for cathodoluminescence imaging

Cathodoluminescence fundamentals - Part 3: Sample preparation for cathodoluminescence imaging

Cathodoluminescence Fundamentals - Part 1 : CL processes

Cathodoluminescence Fundamentals - Part 1 : CL processes

Cathodoluminescence fundamentals - Part 2 : Imaging conditions for CL

Cathodoluminescence fundamentals - Part 2 : Imaging conditions for CL

Failure Analysis using in-SEM nanoprobing

Failure Analysis using in-SEM nanoprobing

Powders and Particles, and 2D materials webinar

Powders and Particles, and 2D materials webinar

AFM in SEM Redefining In Situ Correlative Analyses

AFM in SEM Redefining In Situ Correlative Analyses

Introduction to LEIS - Low Energy Ion Scattering

Introduction to LEIS - Low Energy Ion Scattering

Introduction to TOF-SIMS

Introduction to TOF-SIMS