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3D-Micromac

Accessories / Consumables

Accessories / Consumables

AFM in SEM

Alemnis

Allied High Tech

Allied High Tech

Atom probe sample preparation

Atom probe sample preparation

BIB - Broad Ion Beam Milling

BIB - Broad Ion Beam Milling

Bords-SEM

Bruker Nano

Cathodoluminescence (CL)

Cathodoluminescence (CL)

Coating

Connectomx

Conventional SEM

Conventional SEM

Cressington

Critical Dimension SEM (CD-SEM)

Critical Dimension SEM (CD-SEM)

Cryo Electron Microscopy

Cryo Electron Microscopy

Deben

Defect Inspection & Review

Defect Inspection & Review

DELMIC

Digital Surf

Electrical Nanoprobing

Electrical Nanoprobing

$Electron Backscatter Diffraction (EBSD)$

Electron Backscatter Diffraction (EBSD)

Electron Microscopy

Electron Microscopy

Elektronmikroskop

Field Emission SEM

Field Emission SEM

Fischione

Focused Ion Beam FIB-SEM

Focused Ion Beam FIB-SEM

Grinding & Polishing

Grinding & Polishing

Hitachi High-Tech

Hitachi High-Tech

Measurements in SEM

Image Analysis

Tensile testing in SEM

In-situ Tools

ION-TOF

Ionic Liquid

Kleindiek

Kratos

Laser Micromachining

Laser Micromachining

LEIS

Life Science

Materials & Engineering

Materials & Engineering

Media Cybernetics

Media Cybernetics

Micro CT Tools

Nano-mechanical testing

Nano-mechanical testing

Nenovision

Oxford Nanoanalysis

Oxford Nanoanalysis

Particle analysis

Particle analysis

Sample Preparation

Sample Preparation

Semiconductors

SPM

Surface Analysis

Surface Analysis

Surface Cleaning

Surface Cleaning

Tabletop SEM

Temperature control

TOF-SIMS

Transmission Electron Microscopy TEM

Transmission Electron Microscopy TEM

Used equipment

Used Instruments

Used Instruments

Used SEMs

Flatworm SBF-3D reconstruction

Volume EM - 3D Microscopy

X-ray Microanalysis

X-ray Microanalysis

XEI Evactron

XPS / ESCA