Skip to content
Animated Spectral logo
  • Products
    Electron Microscopy
    Surface Analysis
    Sample Preparation
    In-situ testing
    Used Instruments
    Tabletop SEM Conventional SEM Field Emission SEM Transmission Electron Microscopy Focused Ion Beam 3D Electron Microscopy Cryo Electron Microscopy Critical Dimension SEM Defect Inspection & Review
    Secondary Ion Mass Spectroscopy TOF-SIMS X-ray Photoelectron Spectroscopy XPS / ESCA Low Energy Ion Scattering LEIS AFM in SEM
    Broad Ion Beam Sputter and Evaporaton Coating Grinding & Polishing Surface Cleaning Ionic Liquid
    Nano-mechanical testing Electrical Nanoprobing Micro CT tools AFM in SEM
    Used Scanning Electron Microscopes (SEM) Used equipment
  • Applications
    Semiconductors
    Materials & Engineering
    Life Science
    Metrology Defect inspection Nanoprobing
    Nano-mechanical testing In-situ Tools Sample Preparation
    Transmission Electron Microscopy TEM Volume EM - 3D Microscopy Cryo Electron Microscopy
  • Support
    Customer care
    Remote support
    Support contracts
    Safe Connect
    Submit a ticket
  • Spectral Academy
    Lifelong learning
    Workshops
    User training
  • About us
    Company information
    People
    History
    Terms & Conditions
    Financing
    •
    • Recent searches
        Suggested searches
      • (0)
      Mobile Spectral logo

      You may also like

      You deserve the optimal experience.
      Why not add another of these best sellers to your cart?

      View more recommended products
      View more recommended products
      Shopping cart

      Shopping cart is empty.

      Discover collections
      Discover collections

      Recommended

      Loading...
      Sign in
      Products
      Applications
      Support
      Spectral Academy
      About us
      Products
      Electron Microscopy
      Surface Analysis
      Sample Preparation
      In-situ testing
      Used Instruments
      Applications
      Semiconductors
      Materials & Engineering
      Life Science
      Support
      Customer care
      Remote support
      Support contracts
      Safe Connect
      Submit a ticket
      Spectral Academy
      Lifelong learning
      Workshops
      User training
      About us
      Company information
      People
      History
      Terms & Conditions
      Financing
      Electron Microscopy
      Tabletop SEM
      Conventional SEM
      Field Emission SEM
      Transmission Electron Microscopy
      Focused Ion Beam
      3D Electron Microscopy
      Cryo Electron Microscopy
      Critical Dimension SEM
      Defect Inspection & Review
      Surface Analysis
      Secondary Ion Mass Spectroscopy TOF-SIMS
      X-ray Photoelectron Spectroscopy XPS / ESCA
      Low Energy Ion Scattering LEIS
      AFM in SEM
      Sample Preparation
      Broad Ion Beam
      Sputter and Evaporaton Coating
      Grinding & Polishing
      Surface Cleaning
      Ionic Liquid
      In-situ testing
      Nano-mechanical testing
      Electrical Nanoprobing
      Micro CT tools
      AFM in SEM
      Used Instruments
      Used Scanning Electron Microscopes (SEM)
      Used equipment
      Semiconductors
      Metrology
      Defect inspection
      Nanoprobing
      Materials & Engineering
      Nano-mechanical testing
      In-situ Tools
      Sample Preparation
      Life Science
      Transmission Electron Microscopy TEM
      Volume EM - 3D Microscopy
      Cryo Electron Microscopy
      Customer care
      Remote support
      Support contracts
      Safe Connect
      Submit a ticket
      Lifelong learning
      Workshops
      User training
      Company information
      People
      History
      Terms & Conditions
      Financing
      We use first-party and third-party cookies for analytical purposes and to show you advertising related to your preferences, based on your browsing habits and profile. For more information, please consult our Cookie Policy
      Accept Cookies
      Accessories / Consumables

      Accessories / Consumables

      Explore
      Explore
      AFM in SEM

      AFM in SEM

      Explore
      Explore
      BIB - Broad Ion Beam Milling

      BIB - Broad Ion Beam Milling

      Explore
      Explore
      Bords-SEM

      Bords-SEM

      Explore
      Explore
      Cathodoluminescence (CL)

      Cathodoluminescence (CL)

      Explore
      Explore
      Coating

      Coating

      Explore
      Explore
      Conventional SEM

      Conventional SEM

      Explore
      Explore
      Critical Dimension SEM (CD-SEM)

      Critical Dimension SEM (CD-SEM)

      Explore
      Explore
      Cryo Electron Microscopy

      Cryo Electron Microscopy

      Explore
      Explore
      Defect Inspection & Review

      Defect Inspection & Review

      Explore
      Explore
      Electrical Nanoprobing

      Electrical Nanoprobing

      Explore
      Explore
      Electron Backscatter Diffraction (EBSD)

      Electron Backscatter Diffraction (EBSD)

      Explore
      Explore
      Electron Microscopy

      Electron Microscopy

      Explore
      Explore

      Elektronmikroskop

      Explore
      Explore
      Field Emission SEM

      Field Emission SEM

      Explore
      Explore
      Focused Ion Beam FIB-SEM

      Focused Ion Beam FIB-SEM

      Explore
      Explore
      Grinding & Polishing

      Grinding & Polishing

      Explore
      Explore
      Measurements in SEM

      Image Analysis

      Explore
      Explore
      Tensile testing in SEM

      In-situ Tools

      Explore
      Explore
      Ionic Liquid

      Ionic Liquid

      Explore
      Explore
      LEIS

      LEIS

      Explore
      Explore
      Life Science

      Life Science

      Explore
      Explore
      Materials & Engineering

      Materials & Engineering

      Explore
      Explore

      Micro CT Tools

      Explore
      Explore
      Nano-mechanical testing

      Nano-mechanical testing

      Explore
      Explore
      Sample Preparation

      Sample Preparation

      Explore
      Explore
      Semiconductors

      Semiconductors

      Explore
      Explore

      SPM

      Explore
      Explore
      Surface Analysis

      Surface Analysis

      Explore
      Explore
      Surface Cleaning

      Surface Cleaning

      Explore
      Explore
      Tabletop SEM

      Tabletop SEM

      Explore
      Explore
      TOF-SIMS

      TOF-SIMS

      Explore
      Explore
      Transmission Electron Microscopy TEM

      Transmission Electron Microscopy TEM

      Explore
      Explore

      Used equipment

      Explore
      Explore
      Used Instruments

      Used Instruments

      Explore
      Explore
      Used SEMs

      Used SEMs

      Explore
      Explore
      Flatworm SBF-3D reconstruction

      Volume EM - 3D Microscopy

      Explore
      Explore
      X-ray Microanalysis (EDS/WDS)

      X-ray Microanalysis (EDS/WDS)

      Explore
      Explore
      XPS / ESCA

      XPS / ESCA

      Explore
      Explore

      Call +46 (0)8 410 70 440

      Email to spectral@spectral.se

      Contact us
      Products
      Electron Microscopy
      Surface Analysis
      Sample Preparation
      Used Instruments
      Accessories / Consumables
      Applications
      Semiconductors
      Materials & Engineering
      Life Science
      Support
      Customer care
      Remote support
      Support contracts
      Safe connect
      Spectral Academy
      Lifelong learning
      Informative seminars
      Workshops
      User training
      About us
      Company contact info
      About Spectral
      History
      Financing

      © Spectral. Legal info
      • Choosing a selection results in a full page refresh.