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In association with the major manufacturers µXCT systems including Zeiss, RX Solutions, Tescan/XRE, Nikon, Thermo Fisher Scientific and Waygate/GE Deben is now able to offer an integrated tensile testing solution for your µXCT application. Using tensile testing with µXCT provides a clear visual interpretation of how the properties of materials and composites change under different loading conditions. The compact design of these testing stages allow them to be used with the smallest high resolution micro CT systems providing a range of tensile and compression stages with forces up to 20kN and resolutions down to 25mN. Systems are controlled from the comprehensive MICROTEST tensile stage control software giving a wide range of control functions and a live display of load versus extension and supplied with all required cabling and mounting adaptors for specific µXCT systems.
The CT500 in-situ testing stage is versatile and adaptable, with a weight of less than 1.0kg it is suitable for mounting within the most common mid range µXCT systems such as the Nikon XTH-225, Zeiss/Xradia Versa and GE v|tome|x as well as the so called “nano” systems such as the Zeiss/Xradia XCT-200 and GE Nanotom S.
CT500 general specifications:
CT500 options:
Other Deben in-situ stage systems available for µXCT applications:
(1) Bacteria, 7 kV, magnification 20,000x; (2) Pharmaceutics, magnification 7,500x; (3) Paper, low-vacuum, 2,700x
(1) Bacteria, 7 kV, magnification 20,000x; (2) Pharmaceutics, magnification 7,500x; (3) Paper, low-vacuum, 2,700x
(1) Bacteria, 7 kV, magnification 20,000x; (2) Pharmaceutics, magnification 7,500x; (3) Paper, low-vacuum, 2,700x
(1) Bacteria, 7 kV, magnification 20,000x; (2) Pharmaceutics, magnification 7,500x; (3) Paper, low-vacuum, 2,700x