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Unique Atomic Force Microscope LiteScope is designed to merge the strengths of AFM and SEM techniques, resulting in effective workflow and extending the possibilities of correlative microscopy and in-situ analysis that ware difficult or almost impossible by conventional instrumentation.
AFM brings new in-situ SEM methods of characterization, enabling the analysis of a broad range of properties:
Material mechanical properties
Material magnetic properties
Material electro-mechanical properties
Material electrical properties