Our network of suppliers

We try to build long term relationships with both customers and suppliers. As we work with our customers we learn In addition to the products we provide our customers with local support.

Global development teams regularly receive feedback on local customer requirements, meaning we can ensure top-down continuous improvement in all our products and solutions.

SEM operation control panel
Mats operating SU5000 SEM

Hitachi High-Tech

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Sven Eriksson and Peder Kirkegaard inspecting a single crystal diffractometer

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3D-Micromac

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Accessories / Consumables

Accessories / Consumables

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AFM in SEM

AFM in SEM

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Alemnis

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Allied High Tech

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BIB - Broad Ion Beam Milling

BIB - Broad Ion Beam Milling

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Bords-SEM

Bords-SEM

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Bruker Nano

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Cathodoluminescence (CL)

Cathodoluminescence (CL)

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Coating

Coating

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Connectomx

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Conventional SEM

Conventional SEM

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Cressington

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Critical Dimension SEM (CD-SEM)

Critical Dimension SEM (CD-SEM)

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Cryo Electron Microscopy

Cryo Electron Microscopy

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Deben

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Defect Inspection & Review

Defect Inspection & Review

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DELMIC

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Digital Surf

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Electrical Nanoprobing

Electrical Nanoprobing

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Electron Backscatter Diffraction (EBSD)

Electron Backscatter Diffraction (EBSD)

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Electron Microscopy

Electron Microscopy

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Elektronmikroskop

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Field Emission SEM

Field Emission SEM

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Fischione

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Focused Ion Beam FIB-SEM

Focused Ion Beam FIB-SEM

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Grinding & Polishing

Grinding & Polishing

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Hitachi High-Tech

Hitachi High-Tech

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Measurements in SEM

Image Analysis

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Tensile testing in SEM

In-situ Tools

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ION-TOF

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Ionic Liquid

Ionic Liquid

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Kleindiek

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Kratos

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Laser Micromachining

Laser Micromachining

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LEIS

LEIS

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Life Science

Life Science

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Materials & Engineering

Materials & Engineering

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Media Cybernetics

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Micro CT Tools

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Nano-mechanical testing

Nano-mechanical testing

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Nenovision

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Oxford Nanoanalysis

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Particle analysis

Particle analysis

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Sample Preparation

Sample Preparation

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Semiconductors

Semiconductors

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SPM

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Surface Analysis

Surface Analysis

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Surface Cleaning

Surface Cleaning

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Tabletop SEM

Tabletop SEM

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Temperature control

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TOF-SIMS

TOF-SIMS

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Transmission Electron Microscopy TEM

Transmission Electron Microscopy TEM

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Used equipment

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Used Instruments

Used Instruments

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Used SEMs

Used SEMs

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Flatworm SBF-3D reconstruction

Volume EM - 3D Microscopy

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X-ray Microanalysis

X-ray Microanalysis

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XEI Evactron

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XPS / ESCA

XPS / ESCA

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