What can a tabletop SEM do compared to an optical microscope ?

The tabletop SEM uses a focused electron beam that allows much higher resolution and magnification compared to an optical microscope. In addition the depth of focus is much larger and you can perform chemical analysis with um spatial resolution at the same time as you image the sample.

What is the main difference between a tabletop SEM and a larger SEM ?

A tabletop scanning electron microscope (SEM) offers the benefit of being compact and affordable in comparison to a large full-sized SEM. It requires less power and has lower maintenance costs. While it may not offer the same level of magnification or resolution as a full-sized SEM, a tabletop SEM is a practical alternative for researchers who need to quickly and easily obtain high-quality images of samples. In addition it can be equipped with powerful tools for x-ray microanalysis (EDS) to perform advanced elemental analysis on a micrometer level.

Can you perform X-ray microanalysis (EDS) in a tabletop SEM ?

Absolutely ! We provide dedicated EDS detectors optimized for the small SEMs and the same range of software functions that are available on larger SEMs.

Tabletop SEM

"Clever little SEMs" that can perform powerful tasks and enables imaging and microanalysis in any lab

Tabletop SEM

"Clever little SEMs" that can perform powerful tasks and enables imaging and microanalysis in any lab

Tabletop SEM

In the Tabletop SEM (aka desktop or benchtop SEM) the scanning electron microscopy technique has become easily accessible to many new users and applications. To enable study also of electrically non-conductive materials most desktop SEMs use variable pressure (low vacuum, environmental).

By reducing the size of the system it is has become possible to place the SEM on a table rather than occupying a whole room. Even if the vacuum chamber size is smaller it is still possible to study samples up to several cm:s in diameter and height. Software is simplified to make the system easy to use, also for a non-expert. It is still possible to equip the compact SEM with imaging detectors for secondary electrons (SE), backscattered electrons (BSE) as well as X-ray detection (EDS, EDX) and cathodoluminescence (CL). Systems can be operated manually or automated for applications like chemical particle analysis, gun shot residue, inclusions in metals, technical cleanliness, asbestos detection or quantitative mineralogy.