Understanding the strengths of combining SEM/EDS and XPS for materials characterisation
Discover why X-ray photoelectron spectroscopy (XPS) continues to be one of the most used techniques and how combining with SEM/EDS adds greater understanding for materials characterisation. In this engaging webinar we will address the question ‘Is X-ray Photoelectron Spectroscopy the Ultimate Materials Characterisation Technique?’ We will cut through the hype and explore where XPS truly excels—and where its limitations matter. Whether you’re developing advanced coatings, probing semiconductor interfaces, or pushing the boundaries of surface science, this session offers a sharp, insightful look at how XPS and SEM fit into the modern characterisation toolkit.
This webinar is aimed at materials scientists and researchers who want to learn about the capabilities of modern XPS instrumentation. Data showcased in this webinar has been collated from a range of samples analysed by colleagues in our Manchester, UK applications laboratory.