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Conventional SEM
Scanning Electron Microscopes using traditional tungsten filaments
Conventional SEM
Scanning Electron Microscopes using traditional tungsten filaments
Conventional SEM
With "Conventional" SEM we mean SEMs driven with traditional tungsten filaments.
Today all our models come with variable pressure capabilities (aka low vacuum or environmental SEMs) but without the previous constraints on beam current or restricted field of view.
For applications where the highest magnifications or the lowest beam energies are not required, the conventional scanning electron microscopes using tungsten filaments provide a flexible, robust and cost effective solution.
As the vacuum requirements are not as stringent as for field emission the systems become easier to maintain and less complex to build. Yet the modern generation W-SEMs give high resolution imaging and analysis also in the low acceleration voltage range of 1-5 kV.