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      News

      News
      When Surface Metrology Gets Difficult: Why SEM Has a Role to Play
      15 Apr 2026

      When Surface Metrology Gets Difficult: Why SEM Has a Role to Play

      Surface roughness and topography are rarely just numbers on a drawing. They influence how parts behave in the real world — friction, wear, sealing, adhesion, even how a product looks and feels. Most of us...

      Learn more →
      What Does “Resolution” Really Mean in SEM?
      28 Mar 2026

      What Does “Resolution” Really Mean in SEM?

      What Really Limits SEM Resolution? Beyond the Specification Resolution in SEM is often reduced to a single number. You will see values like “1.0 nm” quoted in brochures and specifications, and they are frequently used...

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      From Segmentation to Workflow: The State of AI in SEM Image Analysis
      20 Mar 2026

      From Segmentation to Workflow: The State of AI in SEM Image Analysis

      Across two recent webinars, we explored both the principles and the practical implementation of AI-based image analysis in electron microscopy. The first session focused on the limitations of classical methods—thresholding, filtering, and rule-based segmentation—and how machine...

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      Tabletop SEM-EDS in Practice: Capabilities, Limits, and Workflows
      20 Mar 2026

      Tabletop SEM-EDS in Practice: Capabilities, Limits, and Workflows

      A recent webinar demonstrated how recent developments in tabletop SEM and EDS technology are closing the gap between compact systems and conventional full-scale SEM platforms. A key enabler is the combination of increased probe current...

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      Technical Conclusions from a Webinar on SEM/EDS and XPS for Surface Analysis
      20 Mar 2026

      Technical Conclusions from a Webinar on SEM/EDS and XPS for Surface Analysis

      A recent webinar explored the relationship between SEM/EDS and XPS as complementary techniques for surface and materials characterization. Rather than focusing on one technique in isolation, the discussion emphasized how differences in interaction physics, sampling...

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      Did you miss our workshop ? Particle Analysis Using AMICS
      03 Nov 2025

      Did you miss our workshop ? Particle Analysis Using AMICS

      Particle Analysis Using AMICS Workshop at Chalmers, October 31st, 2025 If you couldn’t join us for the AMICS workshop in Gothenburg, here’s a quick look at what you missed — and why participants left inspired...

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      The Importance of Cross Sections in Material Analysis with SEM
      09 Jan 2025

      The Importance of Cross Sections in Material Analysis with SEM

      Understanding the internal structure of materials is crucial for advancing product development, ensuring quality control, and solving complex engineering challenges. Cross sections provide a window into the internal layers, interfaces, and microstructural details of materials,...

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      Hitachi City Pang Pong Tournament
      01 Dec 2024

      Hitachi City Pang Pong Tournament

      The 31st Hitachi City Pan-Pong Tournament was held on Sunday, May 23rd, 2010, with 14 divisions ranging from elementary school students to seniors (over 60 years old).

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