Easily image and analyze any sample in minutes
The new TM4000 II benchtop SEM from Hitachi makes advanced electron microscopy quick and easy for any user. High resolution, high contrast, large depth-of-focus imaging, and rapid identification of chemical element distribution are achieved with minimal sample preparation time.
Key Capabilities
- High-resolution imaging with magnification from 25x to 250,000x
- Quickly optimize your results with probe current control and voltage control (up to 20kV)
- Observe clear topographical contrast with the dedicated Secondary Electron (SE) detector
- Rapidly identify compositional variation in your specimen with the Backscatter Electron (BSE) detector
- Eliminate charging problems on electrically insulating specimens by switching vacuum mode with a single click
- Examine large or multiple specimens thanks to the large stage and chamber (samples up to 80mm in diameter and 50mm in height)
- Quickly navigate your sample with the integrated navigation camera and motorized stage *
- Get deeper chemical insights with the x-ray microanalysis (EDX) capability (option), including fast mapping *
- Automate your microscopy and data analysis with options for multi-field acquisition and automated particle and phase analysis *
- Obtain quantitative surface metrology data directly in the SEM *
- Add advanced detection capabilities like STEM or Cathodoluminescence *
- Observe dynamic experiments in-situ with tensile or compression, heating, cooling, electrical probing, and nanoindentation sub-stages *
* Options
