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TM4000Plus II
TM4000Plus II
TM4000Plus II
TM4000Plus II

TM4000Plus II

Easily image and analyze any sample in minutes

The new TM4000 II benchtop SEM from Hitachi makes advanced electron microscopy quick and easy for any user. High resolution, high contrast, large depth-of-focus imaging, and rapid identification of chemical element distribution are achieved with minimal sample preparation time.

Key Capabilities

  • High-resolution imaging with magnification from 25x to 250,000x
  • Quickly optimize your results with probe current control and voltage control (up to 20kV)
  • Observe clear topographical contrast with the dedicated Secondary Electron (SE) detector
  • Rapidly identify compositional variation in your specimen with the Backscatter Electron (BSE) detector
  • Eliminate charging problems on electrically insulating specimens by switching vacuum mode with a single click
  • Examine large or multiple specimens thanks to the large stage and chamber (samples up to 80mm in diameter and 50mm in height)
  • Quickly navigate your sample with the integrated navigation camera and motorized stage *
  • Get deeper chemical insights with the x-ray microanalysis (EDX) capability (option), including fast mapping *
  • Automate your microscopy and data analysis with options for multi-field acquisition and automated particle and phase analysis *
  • Obtain quantitative surface metrology data directly in the SEM *
  • Add advanced detection capabilities like STEM or Cathodoluminescence *
  • Observe dynamic experiments in-situ with tensile or compression, heating, cooling, electrical probing, and nanoindentation sub-stages *

* Options

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Contact Sten about this product

Sten Sturefelt

+46 709 119 281

Email to sten@spectral.se

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Flexible imaging made easy

The TM4000 II benchtop SEM keeps time-to-date and usability at its heart, but not at the cost of the flexibility required by users to truly interpret their specimens. Users can select between BSE (compositional contrast) and SE (surface contrast) on both insulating and conductive specimens without previous sample preparation.

Both BSE and SE detectors can be visualized simultaneously (either mixed or separately) and also in low-vacuum mode. The potential to choose suitable acceleration voltage and probe current helps guarantee optimum results.

Flexible imaging made easy

The TM4000 II benchtop SEM keeps time-to-date and usability at its heart, but not at the cost of the flexibility required by users to truly interpret their specimens. Users can select between BSE (compositional contrast) and SE (surface contrast) on both insulating and conductive specimens without previous sample preparation.

Both BSE and SE detectors can be visualized simultaneously (either mixed or separately) and also in low-vacuum mode. The potential to choose suitable acceleration voltage and probe current helps guarantee optimum results.

Fast navigation

With a fully incorporated navigation camera, users can rapidly find their way around their sample. Users can effortlessly overlay and correlate their optical and SEM images to know exactly where they are and what they have done at all times.

Fast navigation

TM4000 SEM GUI example

With a fully incorporated navigation camera, users can rapidly find their way around their sample. Users can effortlessly overlay and correlate their optical and SEM images to know exactly where they are and what they have done at all times.

High-performance for advanced elemental analysis

The built-in X-ray microanalysis (EDS) system from prominent suppliers, such as Bruker or Oxford Instruments, guarantees precise and rapid elemental analysis with sophisticated features that are present in other benchtop SEMs. Real-time peak deconvolution makes sure that spectral line overlaps are eliminated to offer real elemental distribution and thus prevent inadvertent misinterpretation.

High-performance for advanced elemental analysis

Aztec One GUI

The built-in X-ray microanalysis (EDS) system from prominent suppliers, such as Bruker or Oxford Instruments, guarantees precise and rapid elemental analysis with sophisticated features that are present in other benchtop SEMs. Real-time peak deconvolution makes sure that spectral line overlaps are eliminated to offer real elemental distribution and thus prevent inadvertent misinterpretation.

Automate particle, fiber, or chemical analysis

Users can enhance their statistics and remove time-intensive work by adding Hitachi’s robust modules to automate their matrix, fiber, or particle analysis (a capability usually associated only with full-size SEMs).

Completely automated acquisition and analysis in the TM4000 II benchtop SEM allow users to rapidly define morphology, size, and chemical composition, even across an unlimited number of features. This potential can be crucial in defining materials such as:

  • Metal powders for additive manufacturing
  • Electrospun fibers
  • Identification, liberation, and characterization of the mineral phase
  • Steel cleanliness (to ISO4967 standard)
  • Technical cleanliness (to ISO16232/VDA19 standards)
  • Asbestos analysis (to VDI 3492/ISO14966 standards)

Automate particle, fiber, or chemical analysis

Users can enhance their statistics and remove time-intensive work by adding Hitachi’s robust modules to automate their matrix, fiber, or particle analysis (a capability usually associated only with full-size SEMs).

Completely automated acquisition and analysis in the TM4000 II benchtop SEM allow users to rapidly define morphology, size, and chemical composition, even across an unlimited number of features. This potential can be crucial in defining materials such as:

  • Metal powders for additive manufacturing
  • Electrospun fibers
  • Identification, liberation, and characterization of the mineral phase
  • Steel cleanliness (to ISO4967 standard)
  • Technical cleanliness (to ISO16232/VDA19 standards)
  • Asbestos analysis (to VDI 3492/ISO14966 standards)

Quantitative surface metrology

Material surfaces can be fully interpreted with built-in, tilt-free 3D surface modeling and metrology. Surface parameters, like roughness, angle, or depth, including 3D surface textures explained in ISO 25178, can be measured.

Quantitative surface metrology

Material surfaces can be fully interpreted with built-in, tilt-free 3D surface modeling and metrology. Surface parameters, like roughness, angle, or depth, including 3D surface textures explained in ISO 25178, can be measured.

Frequently asked questions about TM4000Plus II