Activities at IMC21 in Liverpool
Through our partners there are lots of activities at IMC21 that could be of interest.
| Day | Time | Organisation | Type | Presenter / Lead Author | Presentation / Poster | Location |
|---|---|---|---|---|---|---|
| Mon | 11:05–11:20 | Hitachi | Oral | Tetsuya Akashi et al. | Linking Bulk Remanence to Nanoscale Texture in Ryugu Samples Using 3D Magnetic-Field Imaging and FIB-SEM Tomography | 11C |
| Mon | 17:30–18:30 | Hitachi | Poster | Taisei Futakuchi | Development of an In-lens Type FE-SEM, SU9600, Enabling Multifaceted Materials Analysis | Poster area |
| Mon | 17:30–18:30 | Hitachi | Poster | Yoichiro Hashimoto | SEM Imaging of B-doped Diamond Film by Secondary Electron Energy Filtering | Poster area |
| Mon | 17:30–18:30 | Hitachi | Poster | Keisuke Igarashi | In situ STEM Observation of PtFe Alloying Reaction in Pt–Fe₂O₃/SiO₂ Catalyst under a Wide Pressure Range of H₂ Gaseous Atmosphere | Poster area |
| Mon | 17:30–18:30 | Hitachi | Poster | Shinichi Matsubara | Enhancing GFIS–SIM Imaging Efficiency via Random Scanning and Sparse-Sampling Inpainting Algorithms | Poster area |
| Tue | 10:00 | Hitachi | Booth presentation | Dr. Thomas Schmidt | EM Flow Creator: Accelerating EM Automation: Visual Recipes Enhanced by Python Scripting | Booth 149 |
| Tue | 13:00 | SuperSTEM / University of Leeds | Lunchtime workshop | Prof. Quentin Ramasse | Multimodal Low kV STEM | 20/21 |
| Tue | 14:45 | Hitachi | Booth presentation | Dr. Stas Dogel | Clean Samples → Better Data: Smart Contamination Control for SEM and TEM | Booth 149 |
| Tue | 15:45 | Dectris | Booth presentation | Dr. Luca Piazza | Hybrid-Pixel Detectors for Electron Microscopy | Booth 149 |
| Tue | 16:45 | Hitachi | Booth presentation | Dr. Joshua Spille | When Electrons Escape: Schottky vs. Cold Field Emission | Booth 149 |
| Tue | 17:00–17:15 | Hitachi / TU Delft / TNO | Oral | Kazuya Nagashima et al. | Demonstration of Chromatic and Spherical Aberation Correction Using a MEMS-Based Compact Double-Mirror Corrector | 3B |
| Tue | 17:30–18:30 | Hitachi | Poster | Shunya Tanaka | Automation of High-Quality Semiconductor Cross-Sectional SEM Observation Using an In-Lens FE-SEM | Poster area |
| Tue | 17:30–18:30 | Hitachi | Poster | Megumi Kimura | A Method for Calculating Image Sharpness in SEM Considering Specimen Characteristics | Poster area |
| Tue | 17:30–18:30 | Hitachi | Poster | Toshiaki Tanigaki et al. | Time-Resolved Imaging of Photoinduced Electric Potential in pn-Junction | Poster area |
| Tue | 17:30–18:30 | NenoVision | Poster | Alex Johnson | Site-Specific FIB Device Delayering with In-Situ Conductive AFM Characterisation of NAND Memory Structures | Poster area |
| Tue | 17:30–18:30 | Kleindiek Nanotechnik | Poster | Oscar Recalde-Benitez | From In Situ SEM Electrical Diagnostics to Operando (S)TEM of Functional Devices | Poster area |
| Tue | 17:30–18:30 | Alemnis | Poster | Nicholas Randall | Recent Innovation in SEM In-Situ Extreme Mechanical Testing in Nuclear Environments to Study Radiation Damage | Poster area |
| Tue | 17:30–18:30 | 3D-Micromac | Poster | Oytun Tasgit | Adaptive Laser Ablation with Real-Time Depth and Material Sensing for Failure Analysis Sample Preparation | Poster area |
| Tue | 17:30–18:30 | ConnectomX | Poster | Edward Duckworth | Recent Advances in Volume SBF-SEM: Multimodal Integration, CLEM and Workflow Optimisation | Poster area |
| Wed | 10:00 | Hitachi | Booth presentation | Yoichiro Hashimoto | SEM Imaging by Secondary Electron Energy Filtering | Booth 149 |
| Wed | 11:20–11:35 | Hitachi | Oral | Toshihide Agemura et al. | Development of 200-kV Pulsed Electron Gun Using an NEA Photocathode for Aberration-Corrected Pulse-TEM to Capture Atomic Motions | 3B |
| Wed | 13:00 | MIT | Lunchtime workshop | Prof. Frances Ross | Environmental Transmission Electron Microscopy from UHV to Near Atmospheric Pressure | 20/21 |
| Wed | 14:10–14:25 | Hitachi / TNO / TU Delft | Oral | Diederik Maas | Defect Review & Chemical Metrology on PS-PMMA Block-co-polymers by IR-AFM | 13 |
| Wed | 14:45 | Dectris | Booth presentation | Dr. Luca Piazza | Hybrid-Pixel Detectors for Electron Microscopy | Booth 149 |
| Wed | 15:45–16:00 | Hitachi High-Tech | Vendor session | Mami Konomi | Latest Technologies of Hitachi High-Tech Electron Microscopes to Support Multi-scale and Multi-modal Research | 1C |
| Wed | 15:45 | Media Cybernetics | Booth presentation | Media Cybernetics | Overcome EM Imaging Challenges with New AI-Powered Enhancement and Segmentation | Booth 149 |
| Wed | 16:45 | Hitachi | Booth presentation | Hiroaki Matsumoto | Advanced In-situ Environmental S/TEM for Catalysts and Energy Materials | Booth 149 |
| Wed | 17:30–18:30 | Hitachi | Poster | Toshie Yaguchi | Approach to Automation for High-Temperature In-Situ TEM Observation | Poster area |
| Wed | 17:30–18:30 | Hitachi | Poster | Chaobin Zeng | Atomically Visualizing Fe₂O₃ Reduction via ADF-SE Dual Imaging Enabled by a Semi-Open-Cell STEM System | Poster area |
| Wed | 17:30–18:30 | Hitachi | Poster | Akinari Hanawa | Quantitative Evaluation of Configuration-Dependent Image Degradation in In-Situ STEM under Gas Environments Using Monte Carlo Simulation and Experiment | Poster area |
| Wed | 17:30–18:30 | Hitachi | Poster | Mai Yoshihara | A Novel In-Situ Imaging Technique for Liquid Specimens with High Contrast and Low Damage | Poster area |
| Wed | 17:30–18:30 | Hitachi / Nagoya University | Poster | Hirokazu Tamaki | Pushing the Limits of Near-Field Electron Ptychography for Large-Area Quantitative Imaging | Poster area |
| Thu | 10:00 | Hitachi | Booth presentation | Dr. Justyna Grzonka | FIB vs BIB: Selecting the Right Approach for the Length Scale | Booth 149 |
| Thu | 13:00 | University of Victoria | Lunchtime workshop | Prof. Arthur Blackburn | Strategies for Applying 4D-STEM and Ptychography from 20 to 300 keV | 20/21 |
| Thu | 13:40–14:10 | Hitachi R&D | Invited oral | Toshiaki Tanigaki | Electromagnetic Field Observations by Electron Holography | 11A |
| Thu | 14:45 | Media Cybernetics | Booth presentation | Media Cybernetics | Overcome EM Imaging Challenges with New AI-Powered Enhancement and Segmentation | Booth 149 |
| Thu | 15:45 | Hitachi | Booth presentation | Toshie Yaguchi | Automated High-Temperature In-Situ TEM Observation Using EM Flow Creator | Booth 149 |
| Thu | 17:30–18:30 | ConnectomX | Poster | Edward Duckworth | Volume CLEM Across Light Microscopy, SBF-SEM, and FIB-SEM to Investigate Nanoparticle Pollutants in the Brain | Poster area |
