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Upcoming webinars

No webinars are currently scheduled. New sessions are added regularly, so please check back soon.

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Past webinars

AFM in SEM Redefining In Situ Correlative Analyses

AFM in SEM Redefining In Situ Correlative Analyses

What will you learn at the webinar? Introduction to AFM-in-SEM and In-Situ Correlative Microscopy: Learn about the benefits and applications of AFM-in-SEM for in-situ correlative microscopy in materials science, life science, and other research fields....

Introduction to LEIS - Low Energy Ion Scattering

Introduction to LEIS - Low Energy Ion Scattering

An introduction to Low Energy Ion Scattering (LEIS) - a surface analytical technique to quantify the elemental composition of the outermost atomic layer.

Introduction to TOF-SIMS

Introduction to TOF-SIMS

In this presentation Time-Of-Flight Secondary Ion Mass Spectroscopy (TOF-SIMS) is explained.

Overview of complementary techniques to XPS

Overview of complementary techniques to XPS

Dr Dave Surman compares XPS to complementary techniques, like HAXPES, UPS, IPES, REELS and ISS.

XPS Peak fitting and data analysis

XPS Peak fitting and data analysis

Dr Chris Moffit from Kratos Analytical explains peak fitting and data analysis for X-ray Photoelectron Spectroscopy (XPS / ESCA)

Getting XPS analysis right

Getting XPS analysis right

In this lecture Dr Adam Roberts discuss a suitable workflow for XPS analysis.

Mapping using XPS

Mapping using XPS

Dr Adam Roberts explains what lateral information that can be measured using X-ray Photoelectron Spectroscopy (XPS / ESCA)

Analysing depth information using XPS

Analysing depth information using XPS

Dr Chris Moffit from Kratos Analytical explains how to measure depth information using X-ray Photoelectron Spectroscopy (XPS / ESCA)