SU7000 FE-SEM
SU7000 FE-SEM
SU7000 FE-SEM
SU7000 FE-SEM
SU7000 FE-SEM
SU7000 FE-SEM
SU7000 FE-SEM
SU7000 FE-SEM
SU7000 FE-SEM
SU7000 FE-SEM

SU7000 FE-SEM

Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis

(1) Upper detector (UD): microstructure, potential contrasts; (2) Middle detector (MD): high-resolution material contrast; (3) Lower (chamber) detector (LD): topography.

(1) Upper detector (UD): microstructure, potential contrasts; (2) Middle detector (MD): high-resolution material contrast; (3) Lower (chamber) detector (LD): topography.

Advanced imaging and analysis combined

• Sub-nanometer resolution even below 1kV
• Image and analyse any kind of sample easily thanks to field-free optics and variable pressure operation.
• 6@6 : Observe 6 signals simultaneously, and EDS, at 6 mm working distance
 

Flexible sample handling

• Fast sample exchange through either the front door or exchange chamber / load lock
• Easily and safely navigate your sample using the integrated colour NaviCam
• Add in-situ substages for dynamic experiments
 

Clean and flexible vacuum system

• Switch to variable pressure at any time with just a click
• No restriction in field of view or probe current when moving to variable pressure
• Keep both system and samples as clean as possible with the dry vacuum system or by adding a UV or plasma cleaner
 

Future proof

• Made for fast and detailed analysis using single or multiple EDS detectors, EBSD and WDS
• Add CL for more information from minerals, photonics or pharmaceuticals
• Image hydrated or sensitive samples using cryo stage or Hitachi’s patented Ionic Liquid
• 21 accessory ports offers exceptional expandability

 

 

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Frequently asked questions about SU7000 FE-SEM