The Hitachi SU3900SE is a high-resolution Schottky Field Emission Scanning Electron Microscope (FE-SEM) designed for efficient observation of either very large and heavy specimens or multiple specimens in an automated application. Its spacious specimen chamber accommodates samples up to 300 mm in diameter and 130 mm height.
Equipped with an advanced Schottky electron gun, the SU3800SE delivers enhanced resolution at both high and low accelerating voltages, facilitating detailed surface imaging. The inclusion of a low-accelerating-voltage high-sensitivity backscattered electron detector enables comprehensive analysis by providing both compositional and topographic information.
To enhance usability, the SU3900SE features an automatic optical adjustment function that streamlines operations by automating beam alignment, aperture alignment, focus, and stigmation. Additionally, the optional EM Flow Creator allows users to automate sequential image capture by creating customized observation recipes, thereby improving productivity and reducing manual workload.
Fracture surface of steel wire
Dislocations in SUS 316 austenitic stainless steel
Printed circuit board at low magnification
Cross section of layered ceramic capacitor
Zinc oxide particles
High-entropy carbide film
Binder distribution in Lithium-ion battery cathode material
Binder distributiuon in Lithium-ion battery anode material at 200V landing voltage
