Qtac

Quantitative top atomic layer characterisation

The Qtac is a high sensitivity Low Energy Ion Scattering (LEIS) instrument. It is extremely surface sensitive, providing quantitative elemental characterisation of the top atomic layer.

This instrument has been developed to include small spot analysis, surface imaging, and both static and dynamic depth profiling.
Its unique surface sensitivity makes the Qtac the perfect tool to study surface processes. The Qtac provides valuable information in many production and research areas on materials such as catalysts, semiconductors, metals, polymers, and fuel cells.

Key features are

• Quantitative, elemental characterisation of the top atomic layer
• Spectroscopy, imaging and depth profiling capabilities
• Time-of-flight mass filtering for improved sensitivity
• Analysis of rough and non-conductive materials