The IM4000Plus broad Ar+ ion milling system (BIB) from Hitachi is suitable for cross-sectioning or polishing of hard, soft, porous, composite and heat sensitive materials and delivers perfect results.
Reliable High-Performance Milling
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High current Ar+ beam allows quick and consistent cross-sectioning
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Stable low kV (<1 kV) capability for sensitive materials
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Suitable for final polishing, for example, for EBSD, utilizing low-angle milling (FlatMilling), or for contrasting by high-angle milling (relief milling) in just a few minutes
Image Credit: Hitachi High-Tech Europe
Easy Specimen Handling
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Milling position can be readjusted at any time without remounting the specimen
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Ex-situ alignment of mask and specimen makes setup fast and easy
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Resin-embedded samples of up to 50 mm in diameter and 25 mm in height can be loaded for ultimate polishing
Simple Operation and Maintenance
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Minimum and easy parameter settings for all types of applications or samples
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Single ion beam gun allows easy setup and maintenance
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Uniform, high-intensity ion beam throughout the complete voltage range, with separate acceleration voltages and ionization
Easy End-Point Detection
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Real-time milling can be observed with the stereomicroscope
Extendibility
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Cryo cooling can be added for heat sensitive materials
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Vacuum transfer can be added for oxidation sensitive samples
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
