Characterization of Powders and Particles with Integrated AFM-in-SEM
Recorded webinar
Understanding the physical properties of particles—such as surface roughness, adhesion, mechanical stiffness, and 3D morphology—is essential across industries from pharmaceuticals to metallurgy and battery materials. This webinar explores how integrated Atomic Force Microscopy (AFM) inside the Scanning Electron Microscope (SEM) enables advanced correlative analysis of powders and particles.
Learn how AFM-in-SEM provides nanometer-scale topography, mechanical and electrical measurements in situ, even on non-conductive or irregularly shaped samples. We’ll present practical examples and case studies highlighting the benefits of combining SEM’s wide-field imaging and compositional analysis with AFM’s surface-sensitive characterization—all without removing the sample.