Argon Beam Ion Milling: Advanced Techniques for Cross Section Preparation
Recorded webinar
Join this webinar to understand more about Broad Argon Ion Beam (BIB) milling as a precise, stress-free method for preparing high-quality SEM cross-sections and surfaces. Compared to traditional techniques like cutting, cleaving, and polishing, BIB milling minimizes deformation, delamination, and artifacts. It enables precise cross-sections, supports 3D reconstructions, and handles diverse materials, including heat- and air-sensitive specimens, using cryo-sectioning and inert gas transfer. Systems like Hitachi’s IM4000II and IM5000 offer advanced automation, flexible cross-section widths, and ultra-low energy processing. Applications span polymers, composites, semiconductors, and Li-ion batteries, positioning BIB milling as essential for precise SEM sample preparation in research and industry.