New Approaches to Analytical STEM: Atomic Resolution EELS in a 30 kV

New Approaches to Analytical STEM: Atomic Resolution EELS in a 30 kV

Discover how the Hitachi SU9000 FE-SEM, with a diffraction camera and EELS, achieves atomic resolution mapping of complex oxides. Explore versatile EELS applications showcasing the instrument’s advanced capabilities, simplicity, and affordability.