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M6 TOF-SIMS
M6 TOF-SIMS
M6 TOF-SIMS
M6 TOF-SIMS

M6 TOF-SIMS

The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research.

  • - High lateral resolution (< 50 nm) with the new Nanoprobe 50
  • - Mass resolution > 30,000
  • - Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously
  • - Unmatched dynamic range and detection limits
  • - TOF MS/MS with CID fragmentation for molecular structure elucidation
  • - New flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction
  • - Sophisticated SurfaceLab 7 software including fully integrated Multivariate Statistical Analysis (MVSA) software package
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Contact Mats about this product

Mats Eriksson

+46 709 119 666

Email to mats@spectral.se

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