ArBlade5000 Ion Milling System
Principle of Cross Section Milling
Principle of Flat Milling
ArBlade5000 Ion Milling System
Principle of Cross Section Milling
Principle of Flat Milling

ArBlade5000 Ion Milling System

The sophisticated IM5000Ar ion beam milling system from Hitachi can be used to prepare customized cross-sections measuring up to 10 mm wide. It also enhances pre-polished surfaces of samples that are often hard to prepare through conventional means (such as polishing, grinding and cutting).

Processing Performance

  • Custom width uniform cross-sections measuring up to 10 mm wide can be processed
  • Final polishing, for example, for EBSD, utilizing low angle milling (FlatMilling), or for contrasting by high angle milling (relief milling), in just a few minutes
  • A single powerful ion beam gun allows high milling speed
  • Constant ion beam emission from sub-1 kV accelerating voltage
  • Supports fine-surface polishing of sensitive materials

The IM5000: An Advanced Ion Milling System

Image Credit: Hitachi High-Tech Europe

Easy Sample Handling

  • Milling position can be readjusted at all times without remounting the specimen
  • Ex-situ alignment of mask and cross-sectioning range makes setup fast and easy
  • Resin-embedded samples of up to 25 mm in height and 50 mm in diameter can be loaded for ultimate polishing

Simple Operation

  • Easy maintenance and setup with a single ion beam gun
  • Single button push to initiate a process
  • Programmable multi-step processes

Extendability

  • Cryo cooling allows cross-sections on heat sensitive materials
  • Multi-position auto-processing, recipe management and workflow creation
  • Treating oxidation sensitive sample (such as LiB electrodes) without making contact with air

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Sten Sturefelt

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