The IM4000Plus broad Ar+ ion milling system (BIB) from Hitachi is suitable for cross-sectioning or polishing of hard, soft, porous, composite and heat sensitive materials and delivers perfect results.
Reliable High-Performance Milling
- High current Ar+ beam allows quick and consistent cross-sectioning
- Stable low kV (<1 kV) capability for sensitive materials
- Suitable for final polishing, for example, for EBSD, utilizing low-angle milling (FlatMilling), or for contrasting by high-angle milling (relief milling) in just a few minutes
Image Credit: Hitachi High-Tech Europe
Easy Specimen Handling
- Milling position can be readjusted at any time without remounting the specimen
- Ex-situ alignment of mask and specimen makes setup fast and easy
- Resin-embedded samples of up to 50 mm in diameter and 25 mm in height can be loaded for ultimate polishing
Simple Operation and Maintenance
- Minimum and easy parameter settings for all types of applications or samples
- Single ion beam gun allows easy setup and maintenance
- Uniform, high-intensity ion beam throughout the complete voltage range, with separate acceleration voltages and ionization
Easy End-Point Detection
- Real-time milling can be observed with the stereomicroscope
Extendibility
- Cryo cooling can be added for heat sensitive materials
- Vacuum transfer can be added for oxidation sensitive samples
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
