{"product_id":"di4600-dark-field-wafer-defect-inspection-system","title":"DI4600 Dark Field Wafer Defect Inspection System","description":"\u003ch3\u003e\u003ca\u003eDark Field Wafer Defect Inspection System\u003c\/a\u003e\u003c\/h3\u003e\n\u003cp\u003e\u003cspan\u003eIn the production lines of semiconductor fabs, abnormalities should be quickly detected to avoid yield loss.\u003c\/span\u003e\u003cbr\u003e\u003cspan\u003eTo meet this need, DI4600 is designed to detect defects on patterned wafers with high sensitivity and throughput. High sensitivity and throughput are realized by the combination of the sheet-beam optics and the accurate light separation with spatial filters.\u003c\/span\u003e\u003cbr\u003e\u003cspan\u003eDI4600 systems are installed and running as in-line defect management tools in the cutting-edge memory and logic semiconductor fabs.\u003c\/span\u003e\u003c\/p\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":54526503289155,"sku":null,"price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/DI4600.avif?v=1780594280","url":"https:\/\/spectral.se\/products\/di4600-dark-field-wafer-defect-inspection-system","provider":"Spectral AB","version":"1.0","type":"link"}