HF5000 200kV FE-(S)TEM
Si(211) single crystal HAADF-STEM image (left), image intensity profile (right lower) and FFT power spectrum (right upper)
GaAs (110) atomic column EDX elemental mapping
Au/CeO2 catalyst SEM/ADF-/BF-STEM images (upper), and respective high resolution Au particle images (lower)
HF5000 200kV FE-(S)TEM
Si(211) single crystal HAADF-STEM image (left), image intensity profile (right lower) and FFT power spectrum (right upper)
GaAs (110) atomic column EDX elemental mapping
Au/CeO2 catalyst SEM/ADF-/BF-STEM images (upper), and respective high resolution Au particle images (lower)

HF5000 Type A

The HF5000 transmission electron microscope from Hitachi is a 200 kV aberration-corrected CFE TEM or STEM that provides a robust combination of atomic-resolution imaging and analysis, along with extensive automation and sophisticated in-situ capabilities.

Imaging Performance

  • With the fully automated Cs corrector, any kind of user can obtain quality results; alternatively, users can take complete manual control whenever they like
  • The power of atomic resolution SE imaging can be concurrently used with HAADF/ADF/BF
  • Field-free imaging of magnetic specimens in TEM and STEM mode
  • Ptychography and 4D STEM can be used to get the most out of samples

The HF5000: A 200 kV Aberration-Corrected Transmission Electron Microscope

Image Credit: Hitachi High-Tech Europe

Analytical Performance

  • The high brightness and narrow energy CFE gun ensures optimal EELS performance
  • High throughput, high sensitivity EDX with symmetrically opposed dual SDDs offers a collection angle of more than 2 sr

The HF5000: A 200 kV Aberration-Corrected Transmission Electron Microscope

Image Credit: Hitachi High-Tech Europe

Powerful Automation

  • With the help of the Azorus open-source software, multi-platform control systems and datasets can be brought together into a single timeline
  • Users can program their recipes and workflows in Python for regular tasks, tomography high speed acquisition, or the most complicated in-situ experiments

Advanced In-Situ Capabilities

  • In-situ and operando experiments can be performed with gas, liquid, biasing, heating and electrochemistry holders
  • Customized holder design service allows users to undertake the required experiment
  • The SE detector helps observe in-situ reactions of gases with surfaces 

The HF5000: A 200 kV Aberration-Corrected Transmission Electron Microscope

Image Credit: Hitachi High-Tech Europe

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