{"title":"Device Characterization","description":"\u003cp\u003e\u003ca name=\"_Toc90986252\"\u003e\u003c\/a\u003eDevice characterization connects structure, composition and function. By combining high-resolution imaging, microanalysis, electrical testing, optical characterization and correlative workflows, Spectral helps customers understand how materials, interfaces, defects and device geometry influence electrical, optical and functional performance.\u003cbr\u003e\u003c\/p\u003e","products":[{"product_id":"su8600","title":"SU8600 FE-SEM","description":"\u003cdiv class=\"TabContentsArea\"\u003e\n\u003ch1\u003eUltrahigh-Resolution Scanning Electron Microscope SU8600\u003c\/h1\u003e\n\u003ch2\u003e\u003cspan\u003eFeatures\u003c\/span\u003e\u003c\/h2\u003e\n\u003ch3\u003eUltraHigh-Resolution\u003c\/h3\u003e\n\u003cp class=\"TextStyle1\"\u003eHitachi’s high-brightness cold field emission source provides ultrahigh-resolution images even at Ultra-low voltages.\u003c\/p\u003e\n\u003cdiv class=\"ColumnSet\"\u003e\n\u003cdiv class=\"Column1andHalf FirstItem\"\u003e\n\u003cp class=\"ImgOnlyStyle LeftAdjust\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_01.png\" width=\"353\"\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003cdiv class=\"Column1andHalf LastItem\"\u003e\n\u003cp class=\"ImgOnlyStyle RightAdjust\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_02.png\" width=\"353\"\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003c\/div\u003e\n\u003c!--\/ColumnSet--\u003e\n\u003cp class=\"TextStyle4 RightAdjust\"\u003eSpecimen courtesy of Dr. Yoshihiro Kamimura, \u003cbr\u003e National Institute of Advanced Industrial Science and\u003cbr\u003e Technology (AIST), Japan\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eLeft: RHO-type Zeolite particle at low-kV. In order to reveal fine steps structure on surface, the image was acquired at 0.8 kV of landing voltage. This allows the very fine structure of surface steps to be clearly visible (image on right).\u003c\/p\u003e\n\u003ch3\u003eA Smart Detection System for Low Voltage BSE Imaging\u003c\/h3\u003e\n\u003cdiv class=\"ColumnSet\"\u003e\n\u003cdiv class=\"Column1andHalf FirstItem\"\u003e\n\u003cp class=\"TextStyle1\"\u003eCross section image of 3D NAND;\u003cbr\u003eOxide layer and Nitride layer of capacitor are easily distinguishable in the image due to BSE detection capability.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003cdiv class=\"Column1andHalf LastItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_03.png\" width=\"353\"\u003e\u003cbr\u003e Cross Section of 3D NAND (Acceleration Voltage: 1.5 kV)\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003c\/div\u003e\n\u003c!--\/ColumnSet--\u003e\n\u003ch3\u003eFast BSE Imaging : New Out-Column Crystal Type BSED (OCD)\u003c\/h3\u003e\n\u003cdiv class=\"ColumnSet\"\u003e\n\u003cdiv class=\"Column1andHalf FirstItem\"\u003e\n\u003cp class=\"TextStyle1\"\u003eBy using new Out-Column Crystal Type BSED (OCD)*, image acquisition time was less than ONE SECOND, yet lower layer interconnect and Fin FET structure of SRAM are clearly visible.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003cdiv class=\"Column1andHalf LastItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_04.png\" width=\"353\"\u003e\u003cbr\u003e Lower Layer Interconnect of 5 nm process SRAM (Acceleration Voltage: 30 kV, Acquisition time \u0026lt;1 second)\u003c\/p\u003e\n\u003cp class=\"TextStyle4 RightAdjust\"\u003e* Option\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003c\/div\u003e\n\u003c!--\/ColumnSet--\u003e\n\u003ch3\u003eEnhanced User Experience with Advanced Automation\u003c\/h3\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003eThe “EM Flow Creator“ software option allows users to configure repeatable SEM operation sequences.\u003cbr\u003eVarious SEM functions can be assembled in the EM Flow Creator’s window by a drag-and-drop method and then saved as a recipe for later use.\u003cbr\u003eOnce a recipe is configured, automated data collection under the set conditions can be performed with high accuracy and repeatability.\u003c\/p\u003e\n\u003cp class=\"ImgOnlyStyle CenterAdjust\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_05.png\" width=\"353\"\u003e\u003c\/p\u003e\n\u003ch3\u003eFlexible Interface\u003c\/h3\u003e\n\u003cp class=\"TextStyle1\"\u003eDual monitor configuration supports a flexible and highly efficient workspace. Display and save 6 signals simultaneously in order to acquire more information in less time.\u003c\/p\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_06.png\" width=\"720\"\u003e\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003e1, 2, 4 or 6 signals, including the chamber scope(*) or SEM MAP, can be displayed simultaneously on a single monitor. By adding a second screen, the dual-monitor configuration supports enhanced productivity plus expanded workspace and allows the operation panel to be customized with submenus positioned anywhere on either screen.\u003c\/p\u003e\n\u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":42502665109744,"sku":"459-0088","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/SU8600fromleftlowressquare.png?v=1648312314"},{"product_id":"sparc-spectral","title":"SPARC Spectral","description":"\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003ePowerful CL detector\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eObtain measurements quickly and analyze data easily with the most user-friendly, flexible, and powerful cathodoluminescence detection system\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eThe SPARC Spectral system is a unique cathodoluminescence (CL) solution that allows you to acquire high-quality CL data in a fast and simple manner. The system is flexible, modular, and can be customized according to your research needs. The hardware’s functionality can be extended easily with current and future add-ons, while the free open-source software constantly offers new updates and plugins. This provides the user with ample freedom to tailor the system for specific applications and experiments.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eThe SPARC Spectral offers up to six different CL imaging modes allowing detailed analysis of samples. Additionally, its broad spectral range, unsurpassed sensitivity, automated alignment procedure, and ultraflat parabolic mirror ensure the best data quality. The CL system is compatible with SEMs from all the major brands and can be installed on a new SEM or retrofitted to an existing SEM platform. The installation of the system is done by experienced Delmic engineers. They explain and show the possibilities of the system to make sure you acquire the highest quality results of the structural composition and luminescent properties.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cstrong data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eCustomize your system\u003c\/span\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eModify the SPARC system in a matter of minutes with exchangeable modules, gratings, and mirrors\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eMeasure faster with Delmic CL system\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cstrong data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eMeasure faster\u003c\/span\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eDecrease measurement time and experience unprecedented collection efficiency\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eReproduce and compare CL measurements\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cstrong data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eReproduce and compare measurements\u003c\/span\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eCollect reproducible and comparable measurements with a fully motorized mirror stage\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eAnalyze data with open-source software ODEMIS\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cstrong data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eAnalyze easily and acquire insights\u003c\/span\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eOpen-source free software ODEMIS makes data acquisition and analysis painless and easy\u003c\/span\u003e\u003c\/p\u003e","brand":"DELMIC","offers":[{"title":"Default Title","offer_id":42504479408368,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/Header_SPARC_spectral.png?v=1646555000"},{"product_id":"sparc-compact","title":"Sparc Compact","description":"\u003ch2 class=\"BodyText1\" data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\" lang=\"EN-US\"\u003eFast nanoscale insights with CL\u003c\/span\u003e\u003c\/h2\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003eUnderstand more about your sample in less time with a compact, easy-to-use, turnkey cathodoluminescence detector\u003c\/span\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003eSPARC Compact is a high-end cathodoluminescence intensity detector, with colour-filtering capabilities. Easily integrated in SEM, SPARC Compact is a reliable solution for providing insights into processes such as crystal growth zonation in geological samples, and defect structures in semiconductors.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003eThis system is highly modular, which means that it can be upgraded and enhanced as your research evolves and moves forward. And just like the system, Delmic’s team is always there to support you and make sure that the high-quality results you acquire bring you one step closer to your goal.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cb\u003e\u003cspan lang=\"EN-US\"\u003eModify and combine\u003c\/span\u003e\u003c\/b\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003ePerform versatile experiments with exchangeable optical modules\u003c\/span\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003eImage structural composition and luminescence with SPARC Compact\u003c\/span\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cb\u003e\u003cspan lang=\"EN-US\"\u003eEnhance your research\u003c\/span\u003e\u003c\/b\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003eUnderstand the structural composition and luminescence properties simultaneously\u003c\/span\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003eUpgrade SPARC Compact with additional modules\u003c\/span\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cb\u003e\u003cspan lang=\"EN-US\"\u003eUpgrade when needed\u003c\/span\u003e\u003c\/b\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003eExtend the system to perform more advanced CL imaging modes like angle-resolved and hyperspectral CL imaging\u003c\/span\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003eImage and inspect large areas with SPARC Compact\u003c\/span\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cb\u003e\u003cspan lang=\"EN-US\"\u003eImage and inspect large areas\u003c\/span\u003e\u003c\/b\u003e\u003c\/p\u003e\n\u003cp class=\"BodyText1\"\u003e\u003cspan lang=\"EN-US\"\u003eFast PMT detector allows rapid inspection of large areas, ideal for geological applications\u003c\/span\u003e\u003c\/p\u003e","brand":"DELMIC","offers":[{"title":"Default Title","offer_id":42504767045872,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/Header_SPARC_compact_c0525ae3-d729-4cfc-9677-5f0c10878050.png?v=1646570564"},{"product_id":"nanoprobing","title":"Nanoprobing","description":"\u003cp class=\"bodytext\" data-mce-fragment=\"1\"\u003eA simple task in the world of electronics is the measurement of an I-V curve of a single transistor. However, if the size of the transistor is reduced to a few tens of nanometres or less, this task becomes very challenging. Probing on small structures requires a nanoprober with high positioning accuracy and very stable positioners. Our nanoprobing solutions exceed the necessary requirements, providing you with a fast and simple system to effectively increase your probing throughput.\u003c\/p\u003e\n\u003cp class=\"bodytext\" data-mce-fragment=\"1\"\u003eHave a look at the examples below of failure analysis tasks that have been done recently using our products.\u003c\/p\u003e","brand":"Kleindiek","offers":[{"title":"Default Title","offer_id":42504775139568,"sku":"","price":1.0,"currency_code":"SEK","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/web_10nm_2_1.jpg?v=1646571284"},{"product_id":"ebic-ebac","title":"EBIC\/EBAC","description":"\u003ch2 class=\"bodytext\" data-mce-fragment=\"1\"\u003eEBIC Characterization System for EBAC, RCI, EBIV, EBIRCH and EBIC measurements\u003c\/h2\u003e\n\u003cp class=\"bodytext\" data-mce-fragment=\"1\"\u003eWe have designed an easy-to-use EBIC and RCI nanoprobing analysis tool which is compatible with most commercially available SEM's and FIB's. Our system consists of two MM3A-EM micromanipulators, at least one of which is equipped with a low-current measurement kit (LCMK-EM) and a signal amplifier. The amplifier is connected to the video input of the microscope. The recorded signals are amplified and fed back to the microscope thus generating a greyscale map of current in the scanned area. This eliminates the need for additional scan generators and greatly enhances the system's ease-of-use. The acquired data can be overlayed with the imagery generated by the SEM's detectors.\u003c\/p\u003e\n\u003cp class=\"bodytext\" data-mce-fragment=\"1\"\u003ePrimary applications are open detection in integrated circuits, visualization of p-n junctions and localization of resistivity changes in via chains.\u003c\/p\u003e\n\u003cp class=\"bodytext\" data-mce-fragment=\"1\"\u003eThough mainly used for semiconductor failure analysis, this tool can be used for any application that requires accurate measurement of low currents. It can be quickly and easily added to your existing MM3A-EM micromanipulator system.\u003c\/p\u003e\n\u003cp class=\"bodytext\" data-mce-fragment=\"1\"\u003e\u003ca href=\"https:\/\/www.nanotechnik.com\/ps8.html\" title=\"Kleindiek Prober Shuttle\"\u003eLink to our supplier\u003c\/a\u003e\u003cbr\u003e\u003c\/p\u003e","brand":"Kleindiek","offers":[{"title":"Default Title","offer_id":42504778449136,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/ebic_analog_2021_1.jpg?v=1646571523"},{"product_id":"m6","title":"M6 TOF-SIMS","description":"\u003cdiv class=\"spalten-gesamt\" data-mce-fragment=\"1\"\u003e\n\u003cdiv data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"spalte\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"spalte-innen text-inhalt\" data-mce-fragment=\"1\"\u003eThe M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research.\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cbr\u003e\n\u003cdiv class=\"spalten2und3\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"spalte\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"spalte-innen text-inhalt\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"inhalt-aufzaehlung-rechts\" data-mce-fragment=\"1\"\u003e\n\u003cul\u003e\n\u003cli\u003e- High lateral resolution (\u0026lt; 50 nm) with the new Nanoprobe 50\u003c\/li\u003e\n\u003cli\u003e- Mass resolution \u0026gt; 30,000\u003c\/li\u003e\n\u003cli\u003e- Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously\u003c\/li\u003e\n\u003cli\u003e- Unmatched dynamic range and detection limits\u003c\/li\u003e\n\u003cli\u003e- TOF MS\/MS with CID fragmentation for molecular structure elucidation\u003c\/li\u003e\n\u003cli\u003e- New flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction\u003c\/li\u003e\n\u003cli\u003e- Sophisticated SurfaceLab 7 software including fully integrated Multivariate Statistical Analysis (MVSA) software package\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"ION-TOF","offers":[{"title":"Default Title","offer_id":42504819998960,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/the-alle-new-m6_1.jpg?v=1646573311"},{"product_id":"e50","title":"E50 Plasma Cleaner","description":"\u003cdiv class=\"et_pb_column et_pb_column_1_2 et_pb_column_7  et_pb_css_mix_blend_mode_passthrough\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"et_pb_module et_pb_text et_pb_text_6  et_pb_text_align_left et_pb_bg_layout_light\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"et_pb_text_inner\" data-mce-fragment=\"1\"\u003e\n\u003cp data-mce-fragment=\"1\"\u003eThe \u003ca href=\"https:\/\/evactron.com\/evactron-e50\/\" data-mce-fragment=\"1\" title=\"Evactron E50\" data-mce-href=\"https:\/\/evactron.com\/evactron-e50\/\"\u003eEvactron® E50 Plasma De-Contaminator\u003c\/a\u003e is the most powerful model in the Evactron E-Series family of products. E50 plasma cleaner with external hollow cathode RF (XHCRF) plasma radical source (PRS) combines high performance cleaning with simplified design and simple operation.\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003eThe E50 system was designed to be user installed for removal of hydrocarbon contamination from high vacuum chambers such as SEMs, FIBs and large volume chambers. The Evactron E50 Plasma De-Contaminator fits most models of SEM and FIB systems with turbo pump evacuation systems. In operation it provides \u003cstrong data-mce-fragment=\"1\"\u003eThe Fastest Way to Pristine\u003c\/strong\u003e for SEM or FIB instruments.\u003c\/p\u003e\n\u003ch3 data-mce-fragment=\"1\"\u003eSystem Specifications\u003c\/h3\u003e\n\u003cul data-mce-fragment=\"1\"\u003e\n\u003cli data-mce-fragment=\"1\"\u003eDesktop controller with push-button operation\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eAndroid tablet with Bluetooth communication or RS232 serial interface.\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eSimple programing commands for OEM integration\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003ePRS with External RF hollow cathode plasma excitation.\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eVacuum safety interlock and hardware interlock\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eChassis dimensions: WxHxD:  2”x3.5”x8.6” (44×8.9x22cm)\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eRF Power: 20-75 watts at 13.56 MHz XRFHC excited\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003e100-240 VAC 50\/60 Hz input\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eCE\/TUV\/NRTL safety certified\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eRoHS Compliant\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/evactron.com\/evactron-e50\/\" title=\"Evactron E50 Plasma Cleaner\"\u003eLink to our supplier\u003c\/a\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"XEI Evactron","offers":[{"title":"Default Title","offer_id":42504871117040,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/E50white-600x300_1.jpg?v=1646575576"},{"product_id":"litescope","title":"LiteScope AFM-in-SEM","description":"\u003cp\u003e\u003cspan\u003eUnique Atomic Force Microscope LiteScope is designed to merge the \u003c\/span\u003e\u003ca href=\"https:\/\/www.nenovision.com\/technology\/correlative-microscopy\" target=\"_blank\" title=\"Correlative AFM and SEM\" rel=\"noopener noreferrer\"\u003estrengths of\u003cspan\u003e \u003c\/span\u003e\u003cspan\u003eAFM and SEM\u003c\/span\u003e\u003c\/a\u003e\u003cstrong\u003e\u003cspan\u003e \u003c\/span\u003e\u003c\/strong\u003e\u003cspan\u003etechniques, resulting in effective workflow and extending the possibilities of \u003c\/span\u003e\u003ca href=\"https:\/\/www.nenovision.com\/technology\/correlative-microscopy\" title=\"Correlative Electron Microscopy\"\u003ecorrelative microscopy\u003c\/a\u003e\u003cspan\u003e and \u003c\/span\u003e\u003cstrong\u003ein-situ analysis\u003c\/strong\u003e\u003cspan\u003e that ware difficult or almost impossible by conventional instrumentation.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp\u003eAFM brings new in-situ SEM methods of characterization, enabling the analysis of a broad range of properties:\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eMaterial mechanical properties\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003etopography\u003c\/li\u003e\n\u003cli\u003elocal elastic properties (tapping \u0026amp; contact mode)\u003c\/li\u003e\n\u003cli\u003elocal sample hardness (non-topographic)\u003c\/li\u003e\n\u003cli\u003edepth-dependent material characterization\u003c\/li\u003e\n\u003cli\u003evarious in-situ operations\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003cstrong\u003eMaterial magnetic properties\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003emagnetic domain imaging\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003cstrong\u003eMaterial electro-mechanical properties\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003epiezoelectric domain imaging\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003cstrong\u003eMaterial electrical properties\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003econductivity map (including insulated areas)\u003c\/li\u003e\n\u003cli\u003elocal surface potential\u003c\/li\u003e\n\u003cli\u003elocal electrical properties (non-topographic)\u003c\/li\u003e\n\u003cli\u003esub-nanometer topography\u003c\/li\u003e\n\u003c\/ul\u003e","brand":"Nenovision","offers":[{"title":"Default Title","offer_id":46486630629699,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/product-cpem-litescope.png?v=1680770864"}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/collections\/Wafer_square_f1cbdc42-18d3-43ea-914d-aa9904f077af.jpg?v=1780579391","url":"https:\/\/spectral.se\/collections\/semiconductors-copy.oembed","provider":"Spectral AB","version":"1.0","type":"link"}