{"title":"Semicon Sample Preparation","description":"\u003cp\u003eReliable characterization starts with reliable sample preparation. Spectral provides solutions for laser-based access, broad ion beam milling, cross-section preparation, polishing, coating and cleaning. These workflows help expose buried structures, preserve interfaces and create high-quality surfaces for SEM, EDS, CL, AFM, nanoprobing and failure analysis.\u003c\/p\u003e","products":[{"product_id":"im5000","title":"ArBlade5000 Ion Milling System","description":"\u003cp\u003eThe sophisticated IM5000Ar ion beam milling system from Hitachi can be used to prepare customized cross-sections measuring up to 10 mm wide. It also enhances pre-polished surfaces of samples that are often hard to prepare through conventional means (such as polishing, grinding and cutting).\u003c\/p\u003e\n\u003ch2\u003eProcessing Performance\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eCustom width uniform cross-sections measuring up to 10 mm wide can be processed\u003c\/li\u003e\n\u003cli\u003eFinal polishing, for example, for EBSD, utilizing low angle milling (FlatMilling), or for contrasting by high angle milling (relief milling), in just a few minutes\u003c\/li\u003e\n\u003cli\u003eA single powerful ion beam gun allows high milling speed\u003c\/li\u003e\n\u003cli\u003eConstant ion beam emission from sub-1 kV accelerating voltage\u003c\/li\u003e\n\u003cli\u003eSupports fine-surface polishing of sensitive materials\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp align=\"center\"\u003e\u003cimg alt=\"The IM5000: An Advanced Ion Milling System\" src=\"https:\/\/d12oja0ew7x0i8.cloudfront.net\/images\/equipments\/EquipmentImage_7732_16130383009908670.png\" style=\"width: 417px; height: 268px;\" width=\"417\" height=\"268\"\u003e\u003c\/p\u003e\n\u003cp style=\"text-align: right;\"\u003e\u003cspan style=\"color: #4e5f70;\"\u003e\u003cem\u003eImage Credit: Hitachi High-Tech Europe\u003c\/em\u003e\u003c\/span\u003e\u003c\/p\u003e\n\u003ch2\u003eEasy Sample Handling\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eMilling position can be readjusted at all times without remounting the specimen\u003c\/li\u003e\n\u003cli\u003eEx-situ alignment of mask and cross-sectioning range makes setup fast and easy\u003c\/li\u003e\n\u003cli\u003eResin-embedded samples of up to 25 mm in height and 50 mm in diameter can be loaded for ultimate polishing\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch2\u003eSimple Operation\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eEasy maintenance and setup with a single ion beam gun\u003c\/li\u003e\n\u003cli\u003eSingle button push to initiate a process\u003c\/li\u003e\n\u003cli\u003eProgrammable multi-step processes\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch2\u003eExtendability\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eCryo cooling allows cross-sections on heat sensitive materials\u003c\/li\u003e\n\u003cli\u003eMulti-position auto-processing, recipe management and workflow creation\u003c\/li\u003e\n\u003cli\u003eTreating oxidation sensitive sample (such as LiB electrodes) without making contact with air\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/www.hitachi-hightech.com\/global\/en\/products\/microscopes\/peripheral-equipment\/arblade5000.html\" title=\"Hitachi Arblade IM5000 Broad Ion Beam Milling System\" data-mce-fragment=\"1\" data-mce-href=\"https:\/\/www.alliedhightech.com\/equipment\/ad-5-fluid-dispenser\"\u003eLink to our supplier\u003c\/a\u003e\u003c\/p\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":42502666780912,"sku":"08E-0326","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/IM5000withOM.jpg?v=1679346336"},{"product_id":"e50","title":"E50 Plasma Cleaner","description":"\u003cdiv class=\"et_pb_column et_pb_column_1_2 et_pb_column_7  et_pb_css_mix_blend_mode_passthrough\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"et_pb_module et_pb_text et_pb_text_6  et_pb_text_align_left et_pb_bg_layout_light\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"et_pb_text_inner\" data-mce-fragment=\"1\"\u003e\n\u003cp data-mce-fragment=\"1\"\u003eThe \u003ca href=\"https:\/\/evactron.com\/evactron-e50\/\" data-mce-fragment=\"1\" title=\"Evactron E50\" data-mce-href=\"https:\/\/evactron.com\/evactron-e50\/\"\u003eEvactron® E50 Plasma De-Contaminator\u003c\/a\u003e is the most powerful model in the Evactron E-Series family of products. E50 plasma cleaner with external hollow cathode RF (XHCRF) plasma radical source (PRS) combines high performance cleaning with simplified design and simple operation.\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003eThe E50 system was designed to be user installed for removal of hydrocarbon contamination from high vacuum chambers such as SEMs, FIBs and large volume chambers. The Evactron E50 Plasma De-Contaminator fits most models of SEM and FIB systems with turbo pump evacuation systems. In operation it provides \u003cstrong data-mce-fragment=\"1\"\u003eThe Fastest Way to Pristine\u003c\/strong\u003e for SEM or FIB instruments.\u003c\/p\u003e\n\u003ch3 data-mce-fragment=\"1\"\u003eSystem Specifications\u003c\/h3\u003e\n\u003cul data-mce-fragment=\"1\"\u003e\n\u003cli data-mce-fragment=\"1\"\u003eDesktop controller with push-button operation\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eAndroid tablet with Bluetooth communication or RS232 serial interface.\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eSimple programing commands for OEM integration\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003ePRS with External RF hollow cathode plasma excitation.\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eVacuum safety interlock and hardware interlock\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eChassis dimensions: WxHxD:  2”x3.5”x8.6” (44×8.9x22cm)\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eRF Power: 20-75 watts at 13.56 MHz XRFHC excited\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003e100-240 VAC 50\/60 Hz input\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eCE\/TUV\/NRTL safety certified\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eRoHS Compliant\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/evactron.com\/evactron-e50\/\" title=\"Evactron E50 Plasma Cleaner\"\u003eLink to our supplier\u003c\/a\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"XEI Evactron","offers":[{"title":"Default Title","offer_id":42504871117040,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/E50white-600x300_1.jpg?v=1646575576"},{"product_id":"multiprep-300","title":"Multiprep 300 mm","description":"\u003cdiv class=\"product-desc-images\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"description\" data-mce-fragment=\"1\"\u003e\n\u003cp data-mce-fragment=\"1\"\u003eThe MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation. \u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003eCapabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill. The 12\" MultiPrep™ System has a scaled positioning device and higher torque rotation\/oscillation motors for preparation of larger or multiple samples exceeding an area of 1,600 mm².\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003eDual micrometers (pitch and roll) allow precise sample tilt adjustments relative to the abrasive plane. A rigid Z-indexing spindle maintains the predefined geometric orientation throughout the grinding\/polishing process. Digital indicators enable quantifiable material removal, which can be monitored real-time, or preset for unattended operation. Variable speed rotation and oscillation maximize the use of the entire grinding\/polishing disc and minimize artifacts. Adjustable load control expands its capability to handle a range of small (delicate) to large samples.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"Allied High Tech","offers":[{"title":"Default Title","offer_id":42635367612656,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/MultiPrep-300mm.jpg?v=1648989316"},{"product_id":"optiprep","title":"Optiprep Polishing System","description":"\u003cdiv class=\"product-desc-images\"\u003e\n\u003cdiv class=\"description\"\u003e\n\u003cp\u003eThe OptiPrep™ System is designed for production polishing of a wide variety of optical components including Ferrules, Connectors, Waveguides, Silicon V-groove, Optical Chips, Capillary\/Glass Lenses, Fiber Bundles, Ribbon Fiber and Bare Fiber\u003cbr\u003e\u003cbr\u003eOptical polishing applications rely on specific geometry. The OptiPrep™ features a fixed cam-lock interface reference that is parallel to the plane of the platen. Desired sample angles are obtained based on geometric orientation built into the fixture.\u003cbr\u003e\u003cbr\u003eZ-positioning\/indexing is displayed on the digital indicator with 1-micron resolution and can be pre-set for unattended operation. Variable speed rotation\/limit rotation and oscillation with variable sweep maximize use of the entire abrasive surface. \u003cbr\u003e\u003cbr\u003eAdjustable load control expands its capability to handle a range of small (delicate) to large samples. \u003cbr\u003e\u003cbr\u003eApplications where the OptiPrep™ is used often require custom fixtures. Please contact Allied for assistance with a current fixture or to design and manufacture a fixture for a complete solution.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"Allied High Tech","offers":[{"title":"Default Title","offer_id":42635375378672,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/Optiprep.jpg?v=1648989503"},{"product_id":"microprep-pro-femto","title":"microPREP™ PRO FEMTO","description":"\u003cp\u003eThe microPREP PRO FEMTO is your tool for laser-based sample preparation – especially when preparing atom-probe tips (APT) for further analysis.\u003c\/p\u003e\n\u003cp\u003eIts femtosecond laser source and optimized optical setup enable fast material removal with nanometer precision. microPREP PRO FEMTO can prepare APT microtip coupons directly from the sample material with automated workflows.\u003c\/p\u003e\n\u003cp\u003emicroPREP PRO can ablate metals, semiconductors, ceramics, polymers, and compound materials. It creates new vistas for material and process development and failure analysis.\u003c\/p\u003e\n\u003cp\u003eThe femtosecond laser source is the main component of the microPREP PRO FEMTO system. This ultrashort pulsed laser source and an optimized optical setup enable fast material removal with nanometer precision. microPREP PRO FEMTO’s excellent positioning system with piezo actuators and two cameras allows the user to bring specimens straightforwardly into the ultra-precise position for the desired preparation task.\u003cbr\u003emicroPREP PRO FEMTO can prepare APT microtip coupons directly from the sample material with automated workflows.\u003c\/p\u003e\n\u003cp\u003eWith the microPREP PRO FEMTO laser-based sample preparation system, your lab benefits from the following advantages:\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eFree-form sample preparation\u003c\/li\u003e\n\u003cli\u003ePreparation of APT microtip coupons directly from the sample\u003c\/li\u003e\n\u003cli\u003eSamples with micron-level precision\u003c\/li\u003e\n\u003cli\u003eSophisticated workflows for automated tasks\u003c\/li\u003e\n\u003cli\u003eReduced time-to-sample significantly\u003c\/li\u003e\n\u003cli\u003eLower cost per sample\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\u003c\/ul\u003e","brand":"3D-Micromac","offers":[{"title":"Default Title","offer_id":46955434541379,"sku":"","price":1.0,"currency_code":"SEK","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/microPRO_PRO_FEMTO1_web.jpg?v=1689503468"},{"product_id":"anti-curtaining-table","title":"Anti Curtaining Table","description":"\u003cp class=\"bodytext\" data-mce-fragment=\"1\"\u003e\u003cspan\u003eThe Anti Curtaining Table is a four-axis positioning tool especially designed to allow tilting samples to ±90 deg while the entire stage is tilted to FIB angle using the FIB\/SEMs sample stage. The ACT comprises four axes of motion: X (10 mm), Z (3 mm), rotation (unlimited), and tilt (±90 deg). After the ACT's tilt axis has been centered under the electron beam, the region of interest can be moved into position, rotated to adjust the orientation, and lifted up to the tilt axis, allowing true eucentric tilt. This tilt axis can then itself be tilted using the microscope's stage. In this manner it is possible to rock the sample back and forth on an axis that is perpendicular to the focussed ion beam while producing cross-sections or TEM slices. The tilting platform is fitted with a positional encoder with a resolution of 0.1 deg.\u003c\/span\u003e\u003c\/p\u003e","brand":"Kleindiek","offers":[{"title":"Default Title","offer_id":47572945961283,"sku":null,"price":1.0,"currency_code":"SEK","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/web_ACT_8.jpg?v=1702196556"}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/collections\/abelin_20141120_4712_6eb9386c-2134-4f91-91fb-3dfaaef33678.png?v=1780581015","url":"https:\/\/spectral.se\/collections\/sample-preparation-copy.oembed","provider":"Spectral AB","version":"1.0","type":"link"}