{"title":"Products","description":null,"products":[{"product_id":"su8600","title":"SU8600 FE-SEM","description":"\u003cdiv class=\"TabContentsArea\"\u003e\n\u003ch1\u003eUltrahigh-Resolution Scanning Electron Microscope SU8600\u003c\/h1\u003e\n\u003ch2\u003e\u003cspan\u003eFeatures\u003c\/span\u003e\u003c\/h2\u003e\n\u003ch3\u003eUltraHigh-Resolution\u003c\/h3\u003e\n\u003cp class=\"TextStyle1\"\u003eHitachi’s high-brightness cold field emission source provides ultrahigh-resolution images even at Ultra-low voltages.\u003c\/p\u003e\n\u003cdiv class=\"ColumnSet\"\u003e\n\u003cdiv class=\"Column1andHalf FirstItem\"\u003e\n\u003cp class=\"ImgOnlyStyle LeftAdjust\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_01.png\" width=\"353\"\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003cdiv class=\"Column1andHalf LastItem\"\u003e\n\u003cp class=\"ImgOnlyStyle RightAdjust\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_02.png\" width=\"353\"\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003c\/div\u003e\n\u003c!--\/ColumnSet--\u003e\n\u003cp class=\"TextStyle4 RightAdjust\"\u003eSpecimen courtesy of Dr. Yoshihiro Kamimura, \u003cbr\u003e National Institute of Advanced Industrial Science and\u003cbr\u003e Technology (AIST), Japan\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eLeft: RHO-type Zeolite particle at low-kV. In order to reveal fine steps structure on surface, the image was acquired at 0.8 kV of landing voltage. This allows the very fine structure of surface steps to be clearly visible (image on right).\u003c\/p\u003e\n\u003ch3\u003eA Smart Detection System for Low Voltage BSE Imaging\u003c\/h3\u003e\n\u003cdiv class=\"ColumnSet\"\u003e\n\u003cdiv class=\"Column1andHalf FirstItem\"\u003e\n\u003cp class=\"TextStyle1\"\u003eCross section image of 3D NAND;\u003cbr\u003eOxide layer and Nitride layer of capacitor are easily distinguishable in the image due to BSE detection capability.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003cdiv class=\"Column1andHalf LastItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_03.png\" width=\"353\"\u003e\u003cbr\u003e Cross Section of 3D NAND (Acceleration Voltage: 1.5 kV)\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003c\/div\u003e\n\u003c!--\/ColumnSet--\u003e\n\u003ch3\u003eFast BSE Imaging : New Out-Column Crystal Type BSED (OCD)\u003c\/h3\u003e\n\u003cdiv class=\"ColumnSet\"\u003e\n\u003cdiv class=\"Column1andHalf FirstItem\"\u003e\n\u003cp class=\"TextStyle1\"\u003eBy using new Out-Column Crystal Type BSED (OCD)*, image acquisition time was less than ONE SECOND, yet lower layer interconnect and Fin FET structure of SRAM are clearly visible.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003cdiv class=\"Column1andHalf LastItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_04.png\" width=\"353\"\u003e\u003cbr\u003e Lower Layer Interconnect of 5 nm process SRAM (Acceleration Voltage: 30 kV, Acquisition time \u0026lt;1 second)\u003c\/p\u003e\n\u003cp class=\"TextStyle4 RightAdjust\"\u003e* Option\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003c\/div\u003e\n\u003c!--\/ColumnSet--\u003e\n\u003ch3\u003eEnhanced User Experience with Advanced Automation\u003c\/h3\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003eThe “EM Flow Creator“ software option allows users to configure repeatable SEM operation sequences.\u003cbr\u003eVarious SEM functions can be assembled in the EM Flow Creator’s window by a drag-and-drop method and then saved as a recipe for later use.\u003cbr\u003eOnce a recipe is configured, automated data collection under the set conditions can be performed with high accuracy and repeatability.\u003c\/p\u003e\n\u003cp class=\"ImgOnlyStyle CenterAdjust\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_05.png\" width=\"353\"\u003e\u003c\/p\u003e\n\u003ch3\u003eFlexible Interface\u003c\/h3\u003e\n\u003cp class=\"TextStyle1\"\u003eDual monitor configuration supports a flexible and highly efficient workspace. Display and save 6 signals simultaneously in order to acquire more information in less time.\u003c\/p\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8600_06.png\" width=\"720\"\u003e\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003e1, 2, 4 or 6 signals, including the chamber scope(*) or SEM MAP, can be displayed simultaneously on a single monitor. By adding a second screen, the dual-monitor configuration supports enhanced productivity plus expanded workspace and allows the operation panel to be customized with submenus positioned anywhere on either screen.\u003c\/p\u003e\n\u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":42502665109744,"sku":"459-0088","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/SU8600fromleftlowressquare.png?v=1648312314"},{"product_id":"su8700","title":"SU8700 FE-SEM","description":"\u003cdiv class=\"TabContentsArea\"\u003e\n\u003ch1\u003eUltrahigh-Resolution Schottky Scanning Electron Microscope SU8700\u003c\/h1\u003e\n\u003ch2\u003e\u003cspan\u003eFeatures\u003c\/span\u003e\u003c\/h2\u003e\n\u003ch3\u003eUltrahigh-Resolution and Analytical Capability\u003c\/h3\u003e\n\u003cul class=\"LinkListStyle1\"\u003e\n\u003cli\u003eHitachi’s Schottky emitter provides ultrahigh-resolution images and ultrafast microanalysis with high probe current.\u003c\/li\u003e\n\u003cli\u003eIts 0.1kV imaging capability without stage bias expands the application range for beam-sensitive specimens.\u003c\/li\u003e\n\u003cli\u003eA multitude of detectors and options are available to best suit the needs of any user.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8700_01.png\" width=\"720\"\u003e\u003c\/p\u003e\n\u003ch3\u003eEnhanced User Experience with Advanced Automation\u003c\/h3\u003e\n\u003cp class=\"TextStyle1\"\u003eThe “EM Flow Creator“ software option allows users to configure repeatable SEM operation sequences.\u003cbr\u003eVarious SEM functions can be assembled in the EM Flow Creator’s window by a drag-and-drop method and then saved as a recipe for later use.\u003cbr\u003eOnce a recipe is configured, automated data collection under the set conditions can be performed with high accuracy and repeatability.\u003c\/p\u003e\n\u003cp class=\"ImgOnlyStyle CenterAdjust\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8700_02.png\" width=\"353\"\u003e\u003c\/p\u003e\n\u003ch3\u003eNew Display and Interface Features\u003c\/h3\u003e\n\u003cp class=\"TextStyle1\"\u003eDual monitor configuration supports a flexible and highly efficient workspace.\u003cbr\u003e Display and save 6 signals simultaneously in order to acquire more information in less time.\u003cbr\u003e Acquire up to 40,960 x 30,720 pixels of high-resolution information.*\u003c\/p\u003e\n\u003ch3\u003eLarge FOV + High Pixel Resolution\u003c\/h3\u003e\n\u003cp class=\"TextStyle1\"\u003eUltrathin section BSE images of Rat Cerebral Cortex\u003c\/p\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su8700_03.png\" width=\"720\"\u003e\u003cbr\u003especimen courtesy of Dr. Yoshiyuki Kubota , Section of Electron Microscopy, National\u003cbr\u003eInstitute for Physiological Sciences\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eTop-left image was acquired with \u0026gt;120 μm of FOV. The yellow rectangle field in the image is also shown in right image with an increase of digital magnification.\u003cbr\u003e Even after digitally enhancing the original image more than 20 times, the structures of organelle were clearly visible and high quality was maintained.\u003cbr\u003e High-resolution images up to 40,960 x 30,720 pixels are available (*) on SU8700 and SU8600.\u003c\/p\u003e\n\u003cp class=\"TextStyle4 RightAdjust\"\u003e* Option\u003c\/p\u003e\n\u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":42502665437424,"sku":"459-0094","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/SU8700_fromrightlowressquare.png?v=1648312353"},{"product_id":"su7000","title":"SU7000 FE-SEM","description":"\u003cdiv class=\"page-content\" id=\"ctl00_cphBody_divText\"\u003e\n\u003ch1\u003eUltra-High-Resolution Schottky Scanning Electron Microscope SU7000\u003c\/h1\u003e\n\u003cp\u003eThe SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis\u003c\/p\u003e\n\u003cp align=\"center\"\u003e\u003cimg sizes=\"(min-width: 1200px) 673px, (min-width: 1090px) 667px, (min-width: 992px) calc(66.6vw - 60px), (min-width: 787px) 747px, (min-width: 480px) calc(100vw - 40px), calc(100vw - 30px)\" srcset=\"https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219045235\/ri\/747\/src\/images\/equipments\/EquipmentImage_7250_15821059527286795.png 747w, https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219045235\/ri\/650\/src\/images\/equipments\/EquipmentImage_7250_15821059527286795.png 650w, https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219045235\/ri\/450\/src\/images\/equipments\/EquipmentImage_7250_15821059527286795.png 450w\" src=\"https:\/\/d12oja0ew7x0i8.cloudfront.net\/images\/equipments\/EquipmentImage_7250_15821059527286795.png\" alt=\"(1) Upper detector (UD): microstructure, potential contrasts; (2) Middle detector (MD): high-resolution material contrast; (3) Lower (chamber) detector (LD): topography.\" width=\"747\" height=\"393\"\u003e\u003c\/p\u003e\n\u003cp align=\"center\"\u003e\u003cspan style=\"color: #999999;\"\u003e\u003cem\u003e(1) Upper detector (UD): microstructure, potential contrasts; (2) Middle detector (MD): high-resolution material contrast; (3) Lower (chamber) detector (LD): topography.\u003c\/em\u003e\u003c\/span\u003e\u003c\/p\u003e\n\u003ch3\u003eAdvanced imaging and analysis combined\u003c\/h3\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Sub-nanometer resolution even below 1kV\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Image and analyse any kind of sample easily thanks to field-free optics and variable pressure operation.\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• 6@6 : Observe 6 signals simultaneously, and EDS, at 6 mm working distance\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e \u003c\/div\u003e\n\u003ch3\u003eFlexible sample handling\u003c\/h3\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Fast sample exchange through either the front door or exchange chamber \/ load lock\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Easily and safely navigate your sample using the integrated colour NaviCam\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Add in-situ substages for dynamic experiments\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e \u003c\/div\u003e\n\u003ch3\u003eClean and flexible vacuum system\u003c\/h3\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Switch to variable pressure at any time with just a click\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• No restriction in field of view or probe current when moving to variable pressure\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Keep both system and samples as clean as possible with the dry vacuum system or by adding a UV or plasma cleaner\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e \u003c\/div\u003e\n\u003ch3\u003eFuture proof\u003c\/h3\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Made for fast and detailed analysis using single or multiple EDS detectors, EBSD and WDS\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Add CL for more information from minerals, photonics or pharmaceuticals\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Image hydrated or sensitive samples using cryo stage or Hitachi’s patented Ionic Liquid\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• 21 accessory ports offers exceptional expandability\u003c\/div\u003e\n\u003cp align=\"center\"\u003e \u003c\/p\u003e\n\u003ch2\u003e \u003c\/h2\u003e\n\u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":42502665830640,"sku":"458-0071","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/SU7000fotofromleftsquare.png?v=1648312287"},{"product_id":"su3800","title":"SU3800 SEM","description":"\u003cdiv id=\"ctl00_cphBody_divText\" class=\"page-content\"\u003e\n                \u003cp\u003eThe SU3800 and SU3900 are robust and flexible thermionic emitter variable pressure SEMs. The SU3900's extra-large stage and chamber make it perfectly suited to the study of large, heavy or multiple specimens. \u003c\/p\u003e\n\n\u003ch3\u003eImaging performance\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Exceptional low voltage performance to reveal additional fine structure\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Fast and sensitive detectors easily provides surface detail, morphology, composition and crystallography\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Image wet or hydrated samples using cold stage or Hitachi’s patented ionic liquid\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003ch3\u003eHigh-Performance Microanalysis\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Choose between \u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003efully integrated EDS \u003c\/a\u003efrom Oxford Instruments or a flexible choice of EDS\/EBSD\/WDS from any manufacturer\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• \u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003eMultiple ports available \u003c\/a\u003efor analytical detectors, single or multiple EDS, EBSD, WDS or CL\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003ch3\u003eEasily handle and navigate any sample\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• \u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003eLoad samples up to 130 mm height and 300 mm diameter\u003c\/a\u003e with all 5 axes functional\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Never get lost: Easy and safe navigation on your sample using the colour navigation camera\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Perform dynamic experiments in-situ with tensile, heating, cooling or probing sub-stages.\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003ch3\u003eAdvanced automation\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Examine wide areas with image stitching\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Automated particle analysis for technical cleanliness, asbestos, inclusions, fibres, etc.\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• EM-Macro scripting or recording interface allows repetitive or complex procedures to be automated\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003ch3\u003eFuture proof\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• \u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003eIntegrated \u003c\/a\u003e\u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003eCathodoluminescence\u003c\/a\u003e\u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003e (CL)\u003c\/a\u003e for more information from minerals, photonics or pharmaceuticals\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• 3D surface metrology with depth\/angle\/roughness measurement\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003cp align=\"center\"\u003e\u003cimg alt=\"(1) Pollen, low-vacuum SE, 1.5 kV; (2) Metal cross-section, BSE, 3 kV; (3) Copper minerals, low-vacuum, 5 kV.\" src=\"https:\/\/d12oja0ew7x0i8.cloudfront.net\/images\/equipments\/EquipmentImage_7248_15821028057602172.png\" srcset=\"https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219040008\/ri\/771\/src\/images\/equipments\/EquipmentImage_7248_15821028057602172.png 771w, https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219040008\/ri\/750\/src\/images\/equipments\/EquipmentImage_7248_15821028057602172.png 750w, https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219040008\/ri\/550\/src\/images\/equipments\/EquipmentImage_7248_15821028057602172.png 550w, https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219040008\/ri\/450\/src\/images\/equipments\/EquipmentImage_7248_15821028057602172.png 450w\" sizes=\"(min-width: 1200px) 673px, (min-width: 1090px) 667px, (min-width: 992px) calc(66.6vw - 60px), (min-width: 811px) 771px, (min-width: 480px) calc(100vw - 40px), calc(100vw - 30px)\" width=\"771\" height=\"406\"\u003e\u003c\/p\u003e\n\n\u003cp align=\"center\"\u003e\u003cspan style=\"color:#999999;\"\u003e\u003cem\u003e(1) Pollen, low-vacuum SE, 1.5 kV; (2) Metal cross-section, BSE, 3 kV; (3) Copper minerals, low-vacuum, 5 kV.\u003c\/em\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003ch2\u003e \u003c\/h2\u003e\n            \u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":42502665961712,"sku":"58E-0003","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/SU3800.jpg?v=1646498555"},{"product_id":"su3900","title":"SU3900 SEM","description":"\u003cdiv id=\"ctl00_cphBody_divText\" class=\"page-content\"\u003e\n                \u003cp\u003eThe SU3800 and SU3900 are robust and flexible thermionic emitter variable pressure SEMs. The SU3900's extra-large stage and chamber make it perfectly suited to the study of large, heavy or multiple specimens. \u003c\/p\u003e\n\n\u003ch3\u003eImaging performance\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Exceptional low voltage performance to reveal additional fine structure\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Fast and sensitive detectors easily provides surface detail, morphology, composition and crystallography\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Image wet or hydrated samples using cold stage or Hitachi’s patented ionic liquid\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003ch3\u003eHigh-Performance Microanalysis\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Choose between \u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003efully integrated EDS \u003c\/a\u003efrom Oxford Instruments or a flexible choice of EDS\/EBSD\/WDS from any manufacturer\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• \u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003eMultiple ports available \u003c\/a\u003efor analytical detectors, single or multiple EDS, EBSD, WDS or CL\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003ch3\u003eEasily handle and navigate any sample\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• \u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003eLoad samples up to 130 mm height and 300 mm diameter\u003c\/a\u003e with all 5 axes functional\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Never get lost: Easy and safe navigation on your sample using the colour navigation camera\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Perform dynamic experiments in-situ with tensile, heating, cooling or probing sub-stages.\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003ch3\u003eAdvanced automation\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Examine wide areas with image stitching\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• Automated particle analysis for technical cleanliness, asbestos, inclusions, fibres, etc.\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• EM-Macro scripting or recording interface allows repetitive or complex procedures to be automated\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003ch3\u003eFuture proof\u003c\/h3\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• \u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003eIntegrated \u003c\/a\u003e\u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003eCathodoluminescence\u003c\/a\u003e\u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/product_detail\/?pn=em-su3800_su3900\u0026amp;version=\" rel=\"sponsored noopener\"\u003e (CL)\u003c\/a\u003e for more information from minerals, photonics or pharmaceuticals\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e• 3D surface metrology with depth\/angle\/roughness measurement\u003c\/div\u003e\n\n\u003cdiv style=\"margin-left:.19in;\"\u003e \u003c\/div\u003e\n\n\u003cp align=\"center\"\u003e\u003cimg alt=\"(1) Pollen, low-vacuum SE, 1.5 kV; (2) Metal cross-section, BSE, 3 kV; (3) Copper minerals, low-vacuum, 5 kV.\" src=\"https:\/\/d12oja0ew7x0i8.cloudfront.net\/images\/equipments\/EquipmentImage_7248_15821028057602172.png\" srcset=\"https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219040008\/ri\/771\/src\/images\/equipments\/EquipmentImage_7248_15821028057602172.png 771w, https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219040008\/ri\/750\/src\/images\/equipments\/EquipmentImage_7248_15821028057602172.png 750w, https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219040008\/ri\/550\/src\/images\/equipments\/EquipmentImage_7248_15821028057602172.png 550w, https:\/\/d12oja0ew7x0i8.cloudfront.net\/image-handler\/ts\/20200219040008\/ri\/450\/src\/images\/equipments\/EquipmentImage_7248_15821028057602172.png 450w\" sizes=\"(min-width: 1200px) 673px, (min-width: 1090px) 667px, (min-width: 992px) calc(66.6vw - 60px), (min-width: 811px) 771px, (min-width: 480px) calc(100vw - 40px), calc(100vw - 30px)\" width=\"771\" height=\"406\"\u003e\u003c\/p\u003e\n\n\u003cp align=\"center\"\u003e\u003cspan style=\"color:#999999;\"\u003e\u003cem\u003e(1) Pollen, low-vacuum SE, 1.5 kV; (2) Metal cross-section, BSE, 3 kV; (3) Copper minerals, low-vacuum, 5 kV.\u003c\/em\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003ch2\u003e \u003c\/h2\u003e\n            \u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":42502665994480,"sku":"58E-0007","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/SU3900small.jpg?v=1646498829"},{"product_id":"flexsem","title":"FlexSEM1000 II","description":"\u003cdiv id=\"ctl00_cphBody_divText\" class=\"page-content\"\u003e\n\u003cp\u003eThe FlexSEM is a tabletop or floor standing electron microscope combining the performance and flexibility of a full size SEM with the simplicity of a tabletop SEM\u003cbr\u003e\u003cbr\u003e\u003c\/p\u003e\n\u003ch3\u003e\u003cspan class=\"video-lazy-load-title\"\u003eHitachi FlexSEM 1000 Variable-Pressure Scanning Electron Microscope\u003c\/span\u003e\u003c\/h3\u003e\n\u003ch3\u003eFull-SEM imaging performance:\u003c\/h3\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Resolution similar to a full size SEM\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Observe morphology (SE), composition (BSE) or both on conductive or insulating samples\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Full control over acceleration voltage, beam current and vacuum level\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e \u003c\/div\u003e\n\u003ch3\u003eHigh-Performance Elemental Analysis:\u003c\/h3\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Fast and accurate elemental analysis using integrated EDS from leading suppliers\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Show true elemental distribution using live peak deconvolution\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Operate EDS up to 20kV to give access to more peaks\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e \u003c\/div\u003e\n\u003ch3\u003eSafe and easy specimen handling:\u003c\/h3\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Use the navigation camera to locate region of interest\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Easily overlay and correlate your SEM and optical images\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Examine wide areas with image stitching\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Handle large specimens using the 5 axes stage\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e \u003c\/div\u003e\n\u003ch3\u003eGo further:\u003c\/h3\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Automated particle analysis for technical cleanliness, asbestos, inclusions, fibres, etc.\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Image hydrated specimens using a cold stage or Hitachi’s patented ionic liquid\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Add STEM for transmitted electron imaging or CL for geological\/pharmaceutical samples.\u003c\/div\u003e\n\u003cdiv style=\"margin-left: .19in;\"\u003e• Study 3D surface metrology with depth\/angle\/roughness measurements\u003c\/div\u003e\n\u003cp align=\"center\"\u003e \u003c\/p\u003e\n\u003cscript type=\"text\/javascript\"\u003e    $(function() { Azom.wireUpVideoThumbnailLazyLoading(); });  \u003c\/script\u003e\n\u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":42502666223856,"sku":"56E-0009","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/em-flexsem1000_06-square.gif?v=1648309249"},{"product_id":"im5000","title":"ArBlade5000 Ion Milling System","description":"\u003cp\u003eThe sophisticated IM5000Ar ion beam milling system from Hitachi can be used to prepare customized cross-sections measuring up to 10 mm wide. It also enhances pre-polished surfaces of samples that are often hard to prepare through conventional means (such as polishing, grinding and cutting).\u003c\/p\u003e\n\u003ch2\u003eProcessing Performance\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eCustom width uniform cross-sections measuring up to 10 mm wide can be processed\u003c\/li\u003e\n\u003cli\u003eFinal polishing, for example, for EBSD, utilizing low angle milling (FlatMilling), or for contrasting by high angle milling (relief milling), in just a few minutes\u003c\/li\u003e\n\u003cli\u003eA single powerful ion beam gun allows high milling speed\u003c\/li\u003e\n\u003cli\u003eConstant ion beam emission from sub-1 kV accelerating voltage\u003c\/li\u003e\n\u003cli\u003eSupports fine-surface polishing of sensitive materials\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp align=\"center\"\u003e\u003cimg alt=\"The IM5000: An Advanced Ion Milling System\" src=\"https:\/\/d12oja0ew7x0i8.cloudfront.net\/images\/equipments\/EquipmentImage_7732_16130383009908670.png\" style=\"width: 417px; height: 268px;\" width=\"417\" height=\"268\"\u003e\u003c\/p\u003e\n\u003cp style=\"text-align: right;\"\u003e\u003cspan style=\"color: #4e5f70;\"\u003e\u003cem\u003eImage Credit: Hitachi High-Tech Europe\u003c\/em\u003e\u003c\/span\u003e\u003c\/p\u003e\n\u003ch2\u003eEasy Sample Handling\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eMilling position can be readjusted at all times without remounting the specimen\u003c\/li\u003e\n\u003cli\u003eEx-situ alignment of mask and cross-sectioning range makes setup fast and easy\u003c\/li\u003e\n\u003cli\u003eResin-embedded samples of up to 25 mm in height and 50 mm in diameter can be loaded for ultimate polishing\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch2\u003eSimple Operation\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eEasy maintenance and setup with a single ion beam gun\u003c\/li\u003e\n\u003cli\u003eSingle button push to initiate a process\u003c\/li\u003e\n\u003cli\u003eProgrammable multi-step processes\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch2\u003eExtendability\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eCryo cooling allows cross-sections on heat sensitive materials\u003c\/li\u003e\n\u003cli\u003eMulti-position auto-processing, recipe management and workflow creation\u003c\/li\u003e\n\u003cli\u003eTreating oxidation sensitive sample (such as LiB electrodes) without making contact with air\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/www.hitachi-hightech.com\/global\/en\/products\/microscopes\/peripheral-equipment\/arblade5000.html\" title=\"Hitachi Arblade IM5000 Broad Ion Beam Milling System\" data-mce-fragment=\"1\" data-mce-href=\"https:\/\/www.alliedhightech.com\/equipment\/ad-5-fluid-dispenser\"\u003eLink to our supplier\u003c\/a\u003e\u003c\/p\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":42502666780912,"sku":"08E-0326","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/IM5000withOM.jpg?v=1679346336"},{"product_id":"108auto","title":"108Auto Sputter Coater","description":"\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eCressington 108 Sputter Coaters are ideal for routine sample preparation. Compact, economical and simple to operate, they offer rapid pumpdown times, fine-grain coatings and negligible sample heating. Cool, fine-grain sputtering is achieved with a very efficient dc magnetron head. A quick-change target method allows a range of metals to be used. The safety interlocked sputtering supply is fully variable and setting the sputter current is not influenced by vacuum level.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eThe Cressington 108auto sputter coater offers the choice of manual or automatic operation. The specification also includes a vent gas inlet and argon purge control.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eIn automatic mode the coater can be controlled in two ways. The digital timer can be used to give repeatable coatings or the (optional) \u003ca href=\"https:\/\/www.cressington.com\/product_mtm.html\" data-mce-fragment=\"1\" title=\"Cressington Thickness Monitor\" data-mce-href=\"https:\/\/www.cressington.com\/product_mtm.html\"\u003eMTM-20\u003c\/a\u003e controller can be used to terminate the sputtering process at the desired thickness.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp\u003eThe sputter current is set on a digital programmer and is not dependent on the argon gas pressure in the sputtering chamber. Pressure adjustments and current adjustments are carried out separately.\u003c\/p\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/www.cressington.com\/product_108.html\" title=\"Cressington 108Auto Sputter Coater\"\u003eLink to our supplier\u003c\/a\u003e\u003cbr\u003e\u003c\/p\u003e","brand":"Cressington","offers":[{"title":"Default Title","offer_id":42504857944304,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/108a_mtm_1.jpg?v=1646574905"},{"product_id":"208hr","title":"208HR","description":"\u003cp data-mce-fragment=\"1\"\u003e\u003cstrong data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eHigh Resolution Sputter Coater\u003c\/span\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eThe main features are:\u003c\/span\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003e\n\u003cspan data-mce-fragment=\"1\"\u003eWide Choice of Coating Materials:-\u003cbr\u003e\u003c\/span\u003e\u003cspan data-mce-fragment=\"1\"\u003eMagnetron head design and effective gas handling allow a wide choice of target materials (see specification).\u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli\u003e\u003cspan data-mce-fragment=\"1\"\u003ePrecision Thickness Control:-\u003cbr data-mce-fragment=\"1\"\u003e Thickness optimized to the FE-SEM operating voltage using the MTM-20 high resolution thickness controller.\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan data-mce-fragment=\"1\"\u003eMultiple Sample Stage Movements:-\u003cbr data-mce-fragment=\"1\"\u003e Separate rotary, planetary and tilting movements allow optimized coating distribution and coverage. \u003ca href=\"https:\/\/www.cressington.com\/rptstage.html\" title=\"Cressington Rotaty Planetary Tilt (RPT) stage\" data-mce-fragment=\"1\" data-mce-href=\"https:\/\/www.cressington.com\/rptstage.html\"\u003e(view RPT Stage)\u003c\/a\u003e \u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan data-mce-fragment=\"1\"\u003eVariable Chamber Geometry:-\u003cbr data-mce-fragment=\"1\"\u003e Chamber geometry is used to adjust deposition rates from 1.0 nm\/sec to 0.002nm\/sec to optimize structure. \u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan data-mce-fragment=\"1\"\u003eWide Range of Operating Pressures:-\u003cbr data-mce-fragment=\"1\"\u003e Independent power\/pressure adjustment allows operation at argon gas pressure ranges of 0.2 - 0.005 mbar. \u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan data-mce-fragment=\"1\"\u003eCompact Modern Benchtop Design:-\u003cbr data-mce-fragment=\"1\"\u003e Space and energy saving design eliminates need for floor space, water, specialized electrical connections.\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/www.cressington.com\/product_208hr.html\" title=\"Cressington 208HR High Resolution Sputter Coater\"\u003e\u003cspan mce-data-marked=\"1\" data-mce-fragment=\"1\"\u003eLink to our supplier\u003c\/span\u003e\u003c\/a\u003e\u003c\/p\u003e","brand":"Cressington","offers":[{"title":"Default Title","offer_id":42504859353328,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/208hr_rpt_1.jpg?v=1646575004"},{"product_id":"208c","title":"208C","description":"\u003ch3 data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eHigh Vacuum Carbon Coater\u003c\/span\u003e\u003c\/h3\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eThe most advanced Carbon Coater with wide applications for TEM, SEM and microprobe techniques. The modular design permits rapid change between a variety of applications with optimised operation conditions.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cspan\u003eThe main features are:- \u003c\/span\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003e\u003cspan\u003eVoltage controlled rod source gives multiple evaporation capability.\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan\u003eAutomatic evaporation control gives ease of use in a busy environment.\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan\u003eLow cost thickness monitor gives reproducible results.\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan\u003e80 l\/sec turbo pump on a 150mm chamber gives very rapid pumpdown.\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan\u003eReduces operating costs several ways:\u003cbr\u003e - No diffusion pump to leave on continuously.\u003cbr\u003e - No need for water cooling.\u003cbr\u003e - No need for LN2 (dry nitrogen gas optional).\u003c\/span\u003e\u003c\/li\u003e\n\u003cli\u003e\u003cspan data-mce-fragment=\"1\"\u003eCompact, space saving modern benchtop design.\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ca title=\"Cressington 208 Advanced Carbon Coater\" href=\"https:\/\/www.cressington.com\/product_208c.html\" data-mce-fragment=\"1\" data-mce-href=\"https:\/\/www.cressington.com\/product_108ca.html\"\u003eLink to our supplier\u003c\/a\u003e\u003cbr\u003e","brand":"Cressington","offers":[{"title":"Default Title","offer_id":42504865448176,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/208c_mtm_1.jpg?v=1646575318"},{"product_id":"e50","title":"E50 Plasma Cleaner","description":"\u003cdiv class=\"et_pb_column et_pb_column_1_2 et_pb_column_7  et_pb_css_mix_blend_mode_passthrough\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"et_pb_module et_pb_text et_pb_text_6  et_pb_text_align_left et_pb_bg_layout_light\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"et_pb_text_inner\" data-mce-fragment=\"1\"\u003e\n\u003cp data-mce-fragment=\"1\"\u003eThe \u003ca href=\"https:\/\/evactron.com\/evactron-e50\/\" data-mce-fragment=\"1\" title=\"Evactron E50\" data-mce-href=\"https:\/\/evactron.com\/evactron-e50\/\"\u003eEvactron® E50 Plasma De-Contaminator\u003c\/a\u003e is the most powerful model in the Evactron E-Series family of products. E50 plasma cleaner with external hollow cathode RF (XHCRF) plasma radical source (PRS) combines high performance cleaning with simplified design and simple operation.\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003eThe E50 system was designed to be user installed for removal of hydrocarbon contamination from high vacuum chambers such as SEMs, FIBs and large volume chambers. The Evactron E50 Plasma De-Contaminator fits most models of SEM and FIB systems with turbo pump evacuation systems. In operation it provides \u003cstrong data-mce-fragment=\"1\"\u003eThe Fastest Way to Pristine\u003c\/strong\u003e for SEM or FIB instruments.\u003c\/p\u003e\n\u003ch3 data-mce-fragment=\"1\"\u003eSystem Specifications\u003c\/h3\u003e\n\u003cul data-mce-fragment=\"1\"\u003e\n\u003cli data-mce-fragment=\"1\"\u003eDesktop controller with push-button operation\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eAndroid tablet with Bluetooth communication or RS232 serial interface.\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eSimple programing commands for OEM integration\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003ePRS with External RF hollow cathode plasma excitation.\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eVacuum safety interlock and hardware interlock\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eChassis dimensions: WxHxD:  2”x3.5”x8.6” (44×8.9x22cm)\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eRF Power: 20-75 watts at 13.56 MHz XRFHC excited\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003e100-240 VAC 50\/60 Hz input\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eCE\/TUV\/NRTL safety certified\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eRoHS Compliant\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/evactron.com\/evactron-e50\/\" title=\"Evactron E50 Plasma Cleaner\"\u003eLink to our supplier\u003c\/a\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"XEI Evactron","offers":[{"title":"Default Title","offer_id":42504871117040,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/E50white-600x300_1.jpg?v=1646575576"},{"product_id":"aztec-one","title":"AZtec One","description":"\u003cp data-mce-fragment=\"1\"\u003eThe AZtecOne system combines the simple-to-use yet powerful AZtecOne software and the proven stability and accuracy of \u003ca data-mce-fragment=\"1\" href=\"https:\/\/nano.oxinst.com\/products\/xplore\/xplore\" data-mce-href=\"https:\/\/nano.oxinst.com\/products\/xplore\/xplore\" target=\"_blank\"\u003eXplore Detector\u003c\/a\u003e. The AZtecOne system is the ideal solution for carrying out a complex task like EDS as quickly and as easily as possible.\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003eThere is no need for substantial training or advanced knowledge of the EDS technique. Users can be trained in a matter of minutes and will have complete confidence in their results.\u003c\/p\u003e\n\u003cdiv class=\"full-width section-padding\"\u003e\n\u003cdiv class=\"container\"\u003e\n\u003cdiv class=\"tab-content\"\u003e\n\u003cdiv role=\"tabpanel\" class=\"tab-pane active\" id=\"product-information-tab-1\"\u003e\n\u003cdiv class=\"row\"\u003e\n\u003cdiv class=\"col-xs-12\"\u003e\n\u003cp class=\"color-alpha\"\u003e\u003cstrong\u003eEasy and intuitive\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eWith AZtecOne users have all the necessary tools at hand to complete the task quickly and with ease.\u003c\/li\u003e\n\u003cli\u003eStreamlined interface minimises the number of steps to get a result\u003c\/li\u003e\n\u003cli\u003eNew users can be productive in a matter of minutes\u003c\/li\u003e\n\u003cli\u003eNo need for the infrequent user to be retrained every time they need to perform an analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp class=\"color-alpha\"\u003e\u003cstrong\u003eAccurate and dependable\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eAZtecOne works hard behind the scenes so users don’t have to worry about pulse pile-ups, overlapping peaks and other potential artifacts.\u003c\/li\u003e\n\u003cli\u003eTru-Q\u003csup\u003e®\u003c\/sup\u003e technology ensures that users can depend on the elements being automatically detected and that the correct results are being reported\u003c\/li\u003e\n\u003cli\u003eTruMap (option) ensures that the real data distribution is shown on X-ray maps and LineScans\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp class=\"color-alpha\"\u003e\u003cstrong\u003eFast and productive\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eAZtecOne focuses on getting results out as quickly as possible: rapid set-up, real-time results display, reports just a click of a button away\u003c\/li\u003e\n\u003cli\u003eFrom image to report in seconds\u003c\/li\u003e\n\u003cli\u003eFully interactive during acquisition\u003c\/li\u003e\n\u003cli\u003eDuring acquisition users can interact with data in the current or stored projects\u003c\/li\u003e\n\u003cli\u003eQuick and straightforward report generation\u003c\/li\u003e\n\u003cli\u003eChoose components (maps, spectra, linescans) required in the report and AZtecOne does the rest\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/nano.oxinst.com\/products\/aztec\/aztecone\" title=\"Oxford Instruments - Aztec One\"\u003eLink to our supplier\u003c\/a\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"Oxford Nanoanalysis","offers":[{"title":"Default Title","offer_id":42600871133424,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/AZtecLiveOne_Software_Product_Page.png?v=1648309726"},{"product_id":"quantax-75","title":"Quantax 75","description":"\u003cdiv class=\"contentstage stage abstractcomponent aem-GridColumn aem-GridColumn--default--12\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"ui-layout__responsive\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-contentstage ui-separator\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-contentstage__text ui-typography--subheadline\" data-mce-fragment=\"1\"\u003eThe EDS system for the Hitachi TM4000\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cbr\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"responsivegrid aem-GridColumn aem-GridColumn--default--12\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-Grid aem-Grid--12 aem-Grid--default--12\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"twocolumns columns responsivegrid aem-GridColumn aem-GridColumn--default--12\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"ui-layout__responsive\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"ui-separator\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-headline\" data-mce-fragment=\"1\"\u003e\u003cbr data-mce-fragment=\"1\"\u003e\u003c\/div\u003e\n\u003cdiv class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 aem-Grid--phone--12  ui-styles__background-item\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"responsivegrid aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-Grid aem-Grid--6 aem-Grid--default--6 aem-Grid--phone--12\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"ui-typography--richtext aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-text\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"ui-typography--richtext\" data-mce-fragment=\"1\"\u003e\n\u003cp data-mce-fragment=\"1\"\u003eQUANTAX 75 is a new EDS system specially designed for the Hitachi TM4000 Tabletop Microscope. QUANTAX 75 consists of a XFlash\u003csup data-mce-fragment=\"1\"\u003e®\u003c\/sup\u003e silicon drift detector (SDD) with the best energy resolution in its field, a small electronics unit and an easy-to-use ESPRIT Compact software. \u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003eThe system performs qualitative and quantitative analyses of all materials with an element range from boron (5) to californium (98). Besides composition analysis at individual spots on the sample surface, QUANTAX 75 provides powerful line scan and spectral element \u003cspan data-mce-fragment=\"1\"\u003emapping functions. With the customized detector, the analysis and reporting is completed within seconds.\u003c\/span\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003cbr\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"responsivegrid aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-Grid aem-Grid--6 aem-Grid--default--6 aem-Grid--phone--12\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"image image-basic aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"ui-separator\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-Grid aem-Grid--6 aem-Grid--default--6 aem-Grid--phone--12\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"image image-basic aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6\" data-mce-fragment=\"1\"\u003e\n\u003cdiv data-cmp-lazy=\"\" data-cmp-src=\"\/en\/products-and-solutions\/elemental-analyzers\/eds-wds-ebsd-SEM-Micro-XRF\/detectors\/quantax-75\/_jcr_content\/root\/contentpar\/twocolumns_1016482704\/contentpar-1\/image.coreimg.82{.width}.png\/1603809529147\/detectors-quantax-75-02.png\" data-cmp-widths=\"236,304,430,472,608,640,731,860,1462,1920\" data-asset=\"\/content\/dam\/bruker\/int\/en\/products-and-solution\/elemental-analyzers\/electron-microscope-analyzers\/detectors\/detectors-quantax-75-02.png\" data-title=\"ESPRIT Compact software with mapping, report, line scan, and spectrum (from left to right).\" class=\"ui-component-separator cmp-image\" data-mce-fragment=\"1\" itemscope=\"\" itemtype=\"http:\/\/schema.org\/ImageObject\"\u003eESPRIT Compact software with mapping, report, line scan, and spectrum (from left to right).\u003c\/div\u003e\n\u003cdiv data-cmp-lazy=\"\" data-cmp-src=\"\/en\/products-and-solutions\/elemental-analyzers\/eds-wds-ebsd-SEM-Micro-XRF\/detectors\/quantax-75\/_jcr_content\/root\/contentpar\/twocolumns_1016482704\/contentpar-1\/image.coreimg.82{.width}.png\/1603809529147\/detectors-quantax-75-02.png\" data-cmp-widths=\"236,304,430,472,608,640,731,860,1462,1920\" data-asset=\"\/content\/dam\/bruker\/int\/en\/products-and-solution\/elemental-analyzers\/electron-microscope-analyzers\/detectors\/detectors-quantax-75-02.png\" data-title=\"ESPRIT Compact software with mapping, report, line scan, and spectrum (from left to right).\" class=\"ui-component-separator cmp-image\" data-mce-fragment=\"1\" itemscope=\"\" itemtype=\"http:\/\/schema.org\/ImageObject\"\u003e\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 aem-Grid--phone--12  ui-styles__background-item\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"responsivegrid aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-Grid aem-Grid--6 aem-Grid--default--6 aem-Grid--phone--12\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"ui-typography--richtext aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"aem-text\" data-mce-fragment=\"1\"\u003e\n\u003cdiv class=\"ui-typography--richtext\" data-mce-fragment=\"1\"\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cb data-mce-fragment=\"1\"\u003eKey features\u003c\/b\u003e\u003c\/p\u003e\n\u003cul data-mce-fragment=\"1\"\u003e\n\u003cli data-mce-fragment=\"1\"\u003eHigh resolution data aquisition\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eThree different analysis modes: Objects, LineScan and Mapping\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eAutomatic\/interactive element identification starting from boron (5)\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eAccurate element quantification during acquisition\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eDisplay of quantitative results as atomic, weight or oxide percentage\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eColor-coded concentration distributions (element maps) for any number of elements within an arbitrary field of view including a unique live peak separation and background removal\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eReport generation and print formatting\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eExport of results to MS® Word and Excel\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eCompatible with all QUANTAX 70 files (reading and processing)\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003eLanguage options: English, German, Spanish, French, Russian, Chinese, Japanese\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"Bruker Nano","offers":[{"title":"Default Title","offer_id":42600925462768,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/quantax-75.png?v=1648310759"},{"product_id":"microprep-pro-femto","title":"microPREP™ PRO FEMTO","description":"\u003cp\u003eThe microPREP PRO FEMTO is your tool for laser-based sample preparation – especially when preparing atom-probe tips (APT) for further analysis.\u003c\/p\u003e\n\u003cp\u003eIts femtosecond laser source and optimized optical setup enable fast material removal with nanometer precision. microPREP PRO FEMTO can prepare APT microtip coupons directly from the sample material with automated workflows.\u003c\/p\u003e\n\u003cp\u003emicroPREP PRO can ablate metals, semiconductors, ceramics, polymers, and compound materials. It creates new vistas for material and process development and failure analysis.\u003c\/p\u003e\n\u003cp\u003eThe femtosecond laser source is the main component of the microPREP PRO FEMTO system. This ultrashort pulsed laser source and an optimized optical setup enable fast material removal with nanometer precision. microPREP PRO FEMTO’s excellent positioning system with piezo actuators and two cameras allows the user to bring specimens straightforwardly into the ultra-precise position for the desired preparation task.\u003cbr\u003emicroPREP PRO FEMTO can prepare APT microtip coupons directly from the sample material with automated workflows.\u003c\/p\u003e\n\u003cp\u003eWith the microPREP PRO FEMTO laser-based sample preparation system, your lab benefits from the following advantages:\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eFree-form sample preparation\u003c\/li\u003e\n\u003cli\u003ePreparation of APT microtip coupons directly from the sample\u003c\/li\u003e\n\u003cli\u003eSamples with micron-level precision\u003c\/li\u003e\n\u003cli\u003eSophisticated workflows for automated tasks\u003c\/li\u003e\n\u003cli\u003eReduced time-to-sample significantly\u003c\/li\u003e\n\u003cli\u003eLower cost per sample\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\u003c\/ul\u003e","brand":"3D-Micromac","offers":[{"title":"Default Title","offer_id":46955434541379,"sku":"","price":1.0,"currency_code":"SEK","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/microPRO_PRO_FEMTO1_web.jpg?v=1689503468"},{"product_id":"tm4000plus-iii","title":"TM4000Plus III","description":"\u003cdiv class=\"page-content\" id=\"ctl00_cphBody_divText\"\u003e\n\u003ch2\u003e\u003cstrong\u003eEasily image and analyze any sample in minutes\u003c\/strong\u003e\u003c\/h2\u003e\n\u003cp\u003eThe new TM4000 III benchtop SEM from Hitachi builds on the successful TM4000 series of compact SEMs. It makes advanced electron microscopy quick and easy for any user. High resolution, high contrast, large depth-of-focus imaging, and rapid identification of chemical element distribution are achieved with minimal sample preparation time.\u003c\/p\u003e\n\u003ch2\u003eNew functions\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eAdvanced scripting with drag-and-drop programming interface\u003c\/li\u003e\n\u003cli\u003eNew high current mode for even faster imaging and EDS analysis \u003c\/li\u003e\n\u003cli\u003eFilament monitor to help you plan when to change filament\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch2\u003e\u003cstrong\u003eKey Capabilities\u003c\/strong\u003e\u003c\/h2\u003e\n\u003cul\u003e\n\u003cli\u003eHigh-resolution imaging with magnification from 25x to 250,000x\u003c\/li\u003e\n\u003cli\u003eQuickly optimize your results with probe current control and voltage control (up to 20kV)\u003c\/li\u003e\n\u003cli\u003eObserve clear topographical contrast with the dedicated Secondary Electron (SE) detector\u003c\/li\u003e\n\u003cli\u003eRapidly identify compositional variation in your specimen with the Backscatter Electron (BSE) detector\u003c\/li\u003e\n\u003cli\u003eEliminate charging problems on electrically insulating specimens by switching vacuum mode with a single click\u003c\/li\u003e\n\u003cli\u003eExamine large or multiple specimens thanks to the large stage and chamber (samples up to 80mm in diameter and 50mm in height)\u003c\/li\u003e\n\u003cli\u003eQuickly navigate your sample with the integrated navigation camera and motorized stage \u003csup\u003e*\u003c\/sup\u003e\n\u003c\/li\u003e\n\u003cli\u003eGet deeper chemical insights with the x-ray microanalysis (EDX) capability (option), including fast mapping \u003csup\u003e*\u003c\/sup\u003e\n\u003c\/li\u003e\n\u003cli\u003eAutomate your microscopy and data analysis with options for multi-field acquisition and automated particle and phase analysis \u003csup\u003e*\u003c\/sup\u003e\n\u003c\/li\u003e\n\u003cli\u003eObtain quantitative surface metrology data directly in the SEM \u003csup\u003e*\u003c\/sup\u003e\n\u003c\/li\u003e\n\u003cli\u003eAdd advanced detection capabilities like STEM or Cathodoluminescence \u003csup\u003e*\u003c\/sup\u003e\n\u003c\/li\u003e\n\u003cli\u003eObserve dynamic experiments in-situ with tensile or compression, heating, cooling, electrical probing, and nanoindentation sub-stages \u003csup\u003e*\u003c\/sup\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003csup\u003e\u003cem\u003e* Options\u003c\/em\u003e\u003c\/sup\u003e\u003c\/p\u003e\n\u003ch3\u003e\u003cbr\u003e\u003c\/h3\u003e\n\u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":51928465408323,"sku":"55E-0412","price":0.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/products\/TM4000_AZtecsquare.png?v=1648292110"},{"product_id":"su3800se","title":"SU3800SE FE-SEM","description":"\u003cdiv id=\"ctl00_cphBody_divText\" class=\"page-content\" style=\"text-align: start;\"\u003e\n\u003cp\u003eThe Hitachi SU3800SE is a high-resolution Schottky Field Emission Scanning Electron Microscope (FE-SEM) designed for efficient observation of large and heavy specimens. Its spacious specimen chamber accommodates samples up to 200 mm in diameter, eliminating the need for extensive preparation. \u003cspan\u003e\u003cspan class=\"\" data-state=\"closed\"\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/p\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/www.hitachi-hightech.com\/eu\/en\/products\/microscopes\/sem-tem-stem\/fe-sem\/su3800-3900_se.html?utm_source=chatgpt.com\" rel=\"noopener\" class=\"ml-1 inline-flex h-[22px] items-center rounded-xl bg-[#f4f4f4] px-2 text-[0.5em] font-medium text-token-text-secondary dark:bg-token-main-surface-secondary relative top-[-0.094rem] !text-token-text-secondary uppercase hover:bg-token-text-primary hover:!text-token-main-surface-secondary dark:hover:bg-token-text-primary group\" target=\"_blank\"\u003e\u003cspan class=\"truncate\"\u003e\u003c\/span\u003e\u003c\/a\u003e\u003cspan style=\"font-size: 0.875rem;\"\u003eEquipped with an advanced Schottky electron gun, the SU3800SE delivers enhanced resolution at both high and low accelerating voltages, facilitating detailed surface imaging. The inclusion of a low-accelerating-voltage high-sensitivity backscattered electron detector enables comprehensive analysis by providing both compositional and topographic information.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp\u003eTo enhance usability, the SU3800SE features an automatic optical adjustment function that streamlines operations by automating beam alignment, aperture alignment, focus, and stigmation. Additionally, the optional EM Flow Creator allows users to automate sequential image capture by creating customized observation recipes, thereby improving productivity and reducing manual workload.\u003c\/p\u003e\n\u003cp\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/su3800-3900_se_03_tcm56-235679_600x600.webp?v=1735989393\" style=\"float: none;\"\u003e\u003c\/p\u003e\n\u003cdiv class=\"page-content\" id=\"ctl00_cphBody_divText\"\u003e\n\u003cp\u003e\u003cstrong\u003eFracture surface of steel wire\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_01_tcm56-235650.jpg?v=1735978663\" alt=\"\"\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eDislocations in SUS 316 austenitic stainless steel\u003c\/strong\u003e\u003cbr\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_02_tcm56-235651.jpg?v=1735978664\" alt=\"\"\u003e\u003cbr\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003ePrinted circuit board at low magnification\u003cbr\u003e\u003c\/strong\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_03_tcm56-235652.jpg?v=1735978663\"\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eCross section of layered ceramic capacit\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_04_tcm56-235653.jpg?v=1735978663\" alt=\"\"\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eZinc oxide particles\u003cbr\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_05_tcm56-235654.jpg?v=1735978663\"\u003e\u003cbr\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eHigh-entropy carbide film\u003cbr\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_06_tcm56-235655.jpg?v=1735978663\"\u003e\u003cbr\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eBinder distribution in Lithium-ion battery cathode material\u003cbr\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_07_tcm56-235656.jpg?v=1735978664\"\u003e\u003cbr\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eBinder distributiuon in Lithium-ion battery anode material at 200V landing voltage\u003cbr\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_08_tcm56-235657.jpg?v=1735978663\"\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":52074941022531,"sku":"","price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/S_SU3800SE_small_a2200325-e0f9-4e76-86af-b4d74ea6493d.jpg?v=1735979205"},{"product_id":"su3900se","title":"SU3900SE FE-SEM","description":"\u003cdiv class=\"page-content\" id=\"ctl00_cphBody_divText\" style=\"text-align: start;\"\u003e\n\u003cp\u003eThe Hitachi SU3900SE is a high-resolution Schottky Field Emission Scanning Electron Microscope (FE-SEM) designed for efficient observation of either very large and heavy specimens or multiple specimens in an automated application. Its spacious specimen chamber accommodates samples up to 300 mm in diameter and 130 mm height.\u003cspan\u003e\u003cspan data-state=\"closed\" class=\"\"\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/p\u003e\n\u003cp\u003e\u003ca class=\"ml-1 inline-flex h-[22px] items-center rounded-xl bg-[#f4f4f4] px-2 text-[0.5em] font-medium text-token-text-secondary dark:bg-token-main-surface-secondary relative top-[-0.094rem] !text-token-text-secondary uppercase hover:bg-token-text-primary hover:!text-token-main-surface-secondary dark:hover:bg-token-text-primary group\" rel=\"noopener\" href=\"https:\/\/www.hitachi-hightech.com\/eu\/en\/products\/microscopes\/sem-tem-stem\/fe-sem\/su3800-3900_se.html?utm_source=chatgpt.com\" target=\"_blank\"\u003e\u003cspan class=\"truncate\"\u003e\u003c\/span\u003e\u003c\/a\u003e\u003cspan style=\"font-size: 0.875rem;\"\u003eEquipped with an advanced Schottky electron gun, the SU3800SE delivers enhanced resolution at both high and low accelerating voltages, facilitating detailed surface imaging. The inclusion of a low-accelerating-voltage high-sensitivity backscattered electron detector enables comprehensive analysis by providing both compositional and topographic information.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp\u003eTo enhance usability, the SU3900SE features an automatic optical adjustment function that streamlines operations by automating beam alignment, aperture alignment, focus, and stigmation. Additionally, the optional EM Flow Creator allows users to automate sequential image capture by creating customized observation recipes, thereby improving productivity and reducing manual workload.\u003c\/p\u003e\n\u003cp\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/su3800-3900_se_03_tcm56-235679_600x600.webp?v=1735989393\" style=\"float: none;\"\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eFracture surface of steel wire\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_01_tcm56-235650.jpg?v=1735978663\" alt=\"\"\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eDislocations in SUS 316 austenitic stainless steel\u003c\/strong\u003e\u003cbr\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_02_tcm56-235651.jpg?v=1735978664\" alt=\"\"\u003e\u003cbr\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003ePrinted circuit board at low magnification\u003cbr\u003e\u003c\/strong\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_03_tcm56-235652.jpg?v=1735978663\"\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eCross section of layered ceramic capacitor\u003cbr\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_04_tcm56-235653.jpg?v=1735978663\" alt=\"\"\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eZinc oxide particles\u003cbr\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_05_tcm56-235654.jpg?v=1735978663\"\u003e\u003cbr\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eHigh-entropy carbide film\u003cbr\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_06_tcm56-235655.jpg?v=1735978663\"\u003e\u003cbr\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eBinder distribution in Lithium-ion battery cathode material\u003cbr\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_07_tcm56-235656.jpg?v=1735978664\"\u003e\u003cbr\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eBinder distributiuon in Lithium-ion battery anode material at 200V landing voltage\u003cbr\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/application_08_tcm56-235657.jpg?v=1735978663\"\u003e\u003cbr\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":52076253413699,"sku":null,"price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/S_SU3900SE_small_dc23ff3e-7ed7-40bb-8a1a-af5eeffc802c.jpg?v=1735989121"},{"product_id":"material-testing-modules","title":"Material testing modules","description":"\u003cp\u003eKammrath \u0026amp; Weiss have developed a range of mechanical testing modules suited for in-situ experiments in SEM\/FIB, uCT or synchrotron environments.\u003c\/p\u003e\n\u003cp\u003eSeveral testing schemes and geometries : \u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eTensile\u003c\/li\u003e\n\u003cli\u003eCompression\u003c\/li\u003e\n\u003cli\u003eFatigue\u003c\/li\u003e\n\u003cli\u003eBending\u003c\/li\u003e\n\u003cli\u003eCreep-shear\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003eFor work with air sensitive materials there is also a inert sample transfer module.\u003c\/p\u003e\n\u003cp\u003eIn addition low (5K) or high temperatures (1500C) are possible.\u003c\/p\u003e\n\u003cp\u003eThe company is also eager to pursue special developments, so your imagination is possibly the limit to what is possible...\u003c\/p\u003e","brand":"Spectral AB","offers":[{"title":"Default Title","offer_id":54289943724355,"sku":null,"price":0.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/tensile-compression-module-1024x760.png?v=1773990726"},{"product_id":"su9600-fe-sem","title":"SU9600 FE-SEM","description":"\u003c!--\/Section--\u003e\n\u003cdiv class=\"show-print\" id=\"productSub-0\"\u003e\n\u003cdiv class=\"Section\"\u003e\n\u003cdiv class=\"TabContentsArea\"\u003e\n\u003ch1\u003eUltra-high Resolution Scanning Electron Microscope SU9600\u003c\/h1\u003e\n\u003ch2\u003e\u003cspan\u003eOverview\u003c\/span\u003e\u003c\/h2\u003e\n\u003cp class=\"TextStyle1\"\u003eThe SU9600 is HITACHI's new premium SEM. It features unique electron optics, with the sample positioned inside a gap between the upper and lower parts of the objective lens pole piece. This so-called true in-lens concept - combined with the next generation of HITACHI's cold field emission technology - guarantees the highest possible system resolution (SE resolution 0.4 nm @ 30 kV, 1 nm @ 1 kV without requiring beam deceleration technology [0.6nm with beam deceleration]) and stability.\u003c\/p\u003e\n\u003cul class=\"LinkListStyle1\"\u003e\n\u003cli\u003e\u003ca href=\"https:\/\/www.hitachi-hightech.com\/global\/science\/technical\/tech\/microscopes\/cold_fe\/\"\u003eNew coherent cold field emission source\u003c\/a\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cdiv class=\"Column1andHalf LastItem\"\u003e\n\u003cp class=\"TextStyle1\"\u003eThe Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution imaging and high-quality elemental analysis. Unique object lens design has a capability of EELS and diffraction as well.\u003c\/p\u003e\n\u003cdiv class=\"Section\"\u003e\n\u003cul class=\"LinkListStyle1\"\u003e\n\u003cli class=\"NewWin\"\u003eTo learn more about the \u003cstrong\u003elow-voltage EELS and diffraction capabilities of the SU9000\u003c\/strong\u003e, refer to this article: “\u003ca href=\"http:\/\/journals.cambridge.org\/fulltext_content\/supplementary\/MAM22_S3_minisite\/7337\/0604.pdf\" target=\"_blank\"\u003eSTEM\/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging at ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support\u003c\/a\u003e”.*\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003cdl class=\"AdditionalNotesStyle3 ClearFix\"\u003e\n\u003cdt\u003e*:\u003c\/dt\u003e\n\u003cdd\u003edoi:10.1017\/S1431927616003871, Microsc. Microanal. 22 (Suppl 3), 2016, © Microscopy Society of America 2016\u003c\/dd\u003e\n\u003c\/dl\u003e\n\u003c!--\/Section--\u003e\n\u003cdiv class=\"ClearFix\"\u003e\n\u003cdiv class=\"ImgRightAdjust\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg height=\"210\" width=\"300\" alt=\"Image quality evaluation resist\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su9000_01.jpg\"\u003e\u003cbr\u003eSample : ArF Resist\u003cbr\u003eVacc : 500 V\u003cbr\u003eSignal : SE image\u003cbr\u003e\u003cstrong\u003eNo beam deceleration\u003c\/strong\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/ImgRightAdjust--\u003e\n\u003cp class=\"TextStyle1\"\u003eTo make this resolving power usable in practical applications in your lab, the SU9600 utilizes an ultra-stable side-entry sample stage similar to high-end TEM systems and incorporates optimized vibration damping and a closed cabinet to shield the electron optics from environmental noise. Furthermore, the clean vacuum concept of the SU9600 offers a vacuum level in the gun and sample chamber that is one order of magnitude better than the previous generation, thereby minimizing sample contamination artifacts.\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eIn addition to pure, unsurpassed resolution, the SU9600 is also equipped with a remarkable 2+2 detection system for sample surface, composition and transmission observations.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003cp class=\"TextStyle1\"\u003eThe combined use of the patented Super ExB filter with the first upper detector allows users to filter and collect SE and LA-BSE signal energies of interest, thereby suppressing charging artifacts and showing topographical details, and the top detector selectively receives HA-BSE signals, providing topography-free information of material and crystallographical orientation differences. This signal selection technology makes the SU9600 a preferred system for catalyst and other areas of research as well as for biological and pharmaceutical immunolabeling applications when used in combination with a cryogenic sample holder.\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eThe SU9600 is also an incredibly powerful low-kV STEM, often exhibiting higher contrast on critical sample features than high-energy S-TEM systems. In addition, simultaneous Brightfield and annular Darkfield imaging is possible with the Darkfield detector settable to 56 different positions for an optimized selection of Z-contrast of the pattern of interest.\u003c\/p\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg height=\"400\" width=\"600\" alt=\"S-5500 detect\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su9000_02.jpg\"\u003e\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eThe stunning stability of the SU9600 allows a guaranteed STEM resolution specification of 0.34 nm, enabling the observation of graphite lattice fringes for example in a carbon nanotube.\u003c\/p\u003e\n\u003cdiv class=\"ColumnSet\"\u003e\n\u003cdiv class=\"Column1andHalf FirstItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg height=\"189\" width=\"300\" alt=\"SU9000 CNT lattice fringes\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su9000_03.jpg\"\u003e\u003cbr\u003eSample : Multi wall carbon nano tube (lattice fringes)\u003cbr\u003eVacc : 30 kV\u003cbr\u003eMag. : 2,000kx\u003cbr\u003eBright Field(BF)-STEM image\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003cdiv class=\"Column1andHalf LastItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg height=\"300\" width=\"300\" alt=\"Graphene\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su9000_04.jpg\"\u003e\u003cbr\u003eSample : Graphene (lattice fringes)\u003cbr\u003eVacc : 30 kV\u003cbr\u003eMag. : 3,000kx\u003cbr\u003eBright Field(BF)-STEM image\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1andHalf--\u003e\n\u003c\/div\u003e\n\u003c!--\/ColumnSet--\u003e\n\u003cp\u003e \u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/TabContentsArea--\u003e\n\u003c\/div\u003e\n\u003c!--\/Section--\u003e\n\u003c\/div\u003e\n\u003c!--\/productSub--\u003e\n\u003cdiv class=\"show-print\" id=\"productSub-1\"\u003e\n\u003cdiv class=\"Section\"\u003e\n\u003cdiv class=\"TabContentsArea\"\u003e\n\u003ch2\u003e\u003cspan\u003eFeatures\u003c\/span\u003e\u003c\/h2\u003e\n\u003cul class=\"ListStyle1\"\u003e\n\u003cli\u003eThe world's highest SE resolution of 0.4 nm at 30 kV is guaranteed.\u003c\/li\u003e\n\u003cli\u003eUsable magnification of up to 3,000,000x.\u003c\/li\u003e\n\u003cli\u003eNewly designed CFE GUN provides high brightness and an extremely stable emission current.\u003c\/li\u003e\n\u003cli\u003eSuperior low kV performance for observing beam sensitive materials.\u003c\/li\u003e\n\u003cli\u003eNext generation Hitachi In-Lens SEM optics allows for routine observation at 1,000,000x.\u003c\/li\u003e\n\u003cli\u003eImproved vacuum technology that allows for UHV levels for reduced sample contamination.\u003c\/li\u003e\n\u003cli\u003eHighly engineered instrument enclosure featuring both superior strength and stability to allow for high resolution imaging in a broad range of environmental conditions.\u003c\/li\u003e\n\u003cli\u003eNewly designed objective lens enables high resolution imaging at a low acceleration voltage.\u003c\/li\u003e\n\u003cli\u003eSide entry sample exchange system increases throughput by reducing the time required to change samples and automatically positioning the sample at the current WD.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003c!--\/TabContentsArea--\u003e\n\u003c\/div\u003e\n\u003c!--\/Section--\u003e\n\u003c\/div\u003e\n\u003c!--\/productSub--\u003e\n\u003cdiv class=\"show-print\" id=\"productSub-2\"\u003e\n\u003cdiv class=\"Section\"\u003e\n\u003cdiv class=\"TabContentsArea\"\u003e\n\u003ch2\u003e\u003cspan\u003eIn-lens SEM\u003c\/span\u003e\u003c\/h2\u003e\n\u003cp class=\"TextStyle1\"\u003eS-900 launched with 1,000 units installed. \u003cbr\u003eIn 1986, Hitachi released the S-900, the world's first commercial in-lens FE-SEM. With 0.8 nm SE resolution and a usable magnification of up to 800.000x, the new concept of the S-900 truly opened up a new world for researchers in many fields.\u003c\/p\u003e\n\u003cp class=\"ImgOnlyStyle CenterAdjust\"\u003e\u003cimg height=\"230\" width=\"250\" alt=\"S-900\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su9000_05.jpg\"\u003e\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eThe success story continued with the S-5000 (1990), S-5200 (2000) and S-5500 (2004), with each new model setting new standards.\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eIn 2011 Hitachi celebrated 25 years of in-lens FE-SEM technology, and used that opportunity to introduce the new SU9600, the most powerful member in Hitachi's high-end FE-SEM product line-up.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/TabContentsArea--\u003e\n\u003c\/div\u003e\n\u003c!--\/Section--\u003e\n\u003c\/div\u003e\n\u003c!--\/productSub--\u003e\n\u003cdiv class=\"show-print\" id=\"productSub-3\"\u003e\n\u003cdiv class=\"Section\"\u003e\n\u003cdiv class=\"TabContentsArea\"\u003e\n\u003ch2\u003e\u003cspan\u003eLV-STEM\u003c\/span\u003e\u003c\/h2\u003e\n\u003ch3\u003eHigh-Resolution, Analytical STEM\/SEM Providing Simultaneous Chemical and Bonding Analysis, Atomic Resolution, and Surface Imaging at 30kV and below\u003c\/h3\u003e\n\u003cp class=\"TextStyle1\"\u003eInvestigating samples with the full capabilities of STEM at 30 keV and below is an extremely interesting and rapidly growing area of research: providing both Materials and Life Sciences with full SEM and STEM, inclusive EDX, and EELS capabilities, at low voltages. Less beam damage and higher contrast are the key arguments for the Low-Voltage STEM (LV-STEM), a capability that has been out of reach for researchers globally. With the LV-STEM, its low beam energy, increased contrast, and narrow energy spread, investigations of biological material in an unstained condition are becoming a reality for the first time.\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eSince the STEM unit has no imaging lens after the sample, electrons that were inelastically scattered by the sample do not really worsen image quality (they do for TEM). The significance of the lack of chromatic aberrations after the sample increases with decreasing electron energy; samples that typically would require a 100-keV TEM, at the very least, can be investigated with low-keV STEM. Multi-scattering processes and absorption of course still appear—ultimately limiting the acceptable thickness of the specimen. However, the use of high-end specimen preparation techniques, or working with thin samples as is typical in nano-research fields, allows 30-keV STEMs to cover much of the areas of conventional higher-keV TEMs, while at the same time, providing surface information through standard SEM methods, including SE, BSE, and high-angle BSE.\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eThe well-established cold FEG of Hitachi’s high-end SEMs is a tremendous benefit for EELS capabilities as well as the point resolution of STEM. Despite the unusually low voltage for EELS and the increased impact of environmental conditions on low-voltage electrons, we are able to demonstrate better than 400-meV FWHM (full width half maximum, see Figure 1, left) for the ZLP (zero loss peak) of EELS, allowing clear and crisp EELS data for fine structure investigations. For example, eliciting the tiny changes in the π bonding for the Graphene as layer after layer is added demonstrates the sensitivity of the LV-STEM (see Figure 1, right). The LV-STEM also has a 2\u003csup\u003end\u003c\/sup\u003e dedicated EELS detector with 3 elements, allowing the rapid (10,000 fps) acquisition of energy-filtered BF STEM images, Plasmon images, or the rapid collection of elemental maps. Switching between both detectors is easy and relies on Hitachi’s own unique design.\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eThe LV-STEM feature (Figure 2) complements SE imaging and makes no compromise. Typical images taken at 30 keV without a Cs corrector or Cc corrector approach 0.2-nm resolution establishing the LV-STEM as the true performance leader for ≤ 30 keV microscopy. The importance of simultaneously acquiring STEM and SE data is demonstrated in Figure 3.\u003c\/p\u003e\n\u003cp class=\"TextStyle1\"\u003eAs this microscope can handle samples up to 5.0 mm × 9.5 mm × 3.5 mm, the optional windowless EDX detector supports the analysis of both thin and bulk areas. At an incredible collection angle of 0.7 sr, acquisition times for EDX maps are short (see details in Figure 4), making the LV-STEM a truly ground-breaking microscope for both Materials and Life Sciences applications.\u003c\/p\u003e\n\u003cdiv class=\"Section\"\u003e\n\u003cp class=\"TextStyle1\"\u003e\u003cstrong\u003eReferences\u003c\/strong\u003e\u003c\/p\u003e\n\u003cdl class=\"AdditionalNotesStyle2 ClearFix\"\u003e\n\u003cdt\u003e1)\u003c\/dt\u003e\n\u003cdd\u003eR.F. Egerton, “Electron Energy-Loss Spectroscopy in Electron Microscope”, Springer, New York\u003c\/dd\u003e\n\u003cdt\u003e2)\u003c\/dt\u003e\n\u003cdd\u003eK. Suenaga et al., Nature, Vol.468 (2010), 1088-1090\u003c\/dd\u003e\n\u003cdt\u003e3)\u003c\/dt\u003e\n\u003cdd\u003eG. Algara-Siller, O. Lehtinen, A. Turchanin and U. Kaiser, (2014). Appl. Phys. Lett., 104, 153115.\u003c\/dd\u003e\n\u003cdt\u003e4)\u003c\/dt\u003e\n\u003cdd\u003eThe authors wish to thank Dr. Tsuyohiko Fujigaya, Kyushu University for providing the samples.\u003c\/dd\u003e\n\u003c\/dl\u003e\n\u003c\/div\u003e\n\u003c!--\/Section--\u003e\n\u003cdiv class=\"Section\"\u003e\n\u003cdiv class=\"ColumnSet\"\u003e\n\u003cdiv class=\"Column2 FirstItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg height=\"210\" width=\"475\" alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su9000_vlstem01.png\"\u003e\u003cbr\u003e\u003cstrong\u003eFigure 1\u003c\/strong\u003e Left: despite the low (± 30 keV) energy of these electrons, the energy spread of the electron beam, measured by our own Hitachi EELS is 400 meV or less:. Right: EELS spectra differentiating between single , double and triple layers of graphene , graphite, diamond, and amorphous carbon.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--Column2--\u003e\n\u003cdiv class=\"Column1 LastItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg height=\"210\" width=\"210\" alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su9000_vlstem02.png\"\u003e\u003cbr\u003e\u003cstrong\u003eFigure 2\u003c\/strong\u003e The low-pass-filtered BF STEM of Graphene at 30 keV shows a resolution of close to 0.2 nm; the 0.142 nm atom distances are not resolved.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1--\u003e\n\u003c\/div\u003e\n\u003c!--\/ColumnSet--\u003e\n\u003cdiv class=\"ColumnSet\"\u003e\n\u003cdiv class=\"Column2 FirstItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg height=\"165\" width=\"436\" alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su9000_vlstem03.png\"\u003e\u003cbr\u003e\u003cstrong\u003eFigure 3\u003c\/strong\u003e Left: The high-resolution 30-keV BF STEM image by itself makes it difficult to model its 3D structure. Right: Only in combination with the (simultaneously acquired) high-resolution SE image, the real structure of this sample becomes obvious and modeling this structure as a 3D model would be quite manageable.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--Column2--\u003e\n\u003cdiv class=\"Column1 LastItem\"\u003e\n\u003cp class=\"ImgOnlyStyle\"\u003e\u003cimg height=\"160\" width=\"230\" alt=\"\" src=\"https:\/\/www.hitachi-hightech.com\/image\/global\/science\/products\/microscopes\/electron-microscope\/fe-sem\/su9000_vlstem04.png\"\u003e\u003cbr\u003e\u003cstrong\u003eFigure 4\u003c\/strong\u003e Elemental EDX map (Au M) at 30 kV, The size of the nano-particles is in the range of 5-10 nm. Acquisition time is 3.5 min at a current of 1 nA\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c!--\/Column1--\u003e\n\u003c\/div\u003e\n\u003c!--\/ColumnSet--\u003e\n\u003c\/div\u003e\n\u003c!--\/Section--\u003e\n\u003cul class=\"LinkListStyle1\"\u003e\n\u003cli class=\"Pdf\"\u003e\u003ca href=\"https:\/\/www.hitachi-hightech.com\/file\/global\/pdf\/science\/products\/microscopes\/electron-microscope\/fe-sem\/em-su9000_vlstem01.pdf\"\u003eHigh-Resolution, Analytical STEM\/SEM Providing Simultaneous Chemical and Bonding Analysis, Atomic Resolution, and Surface Imaging at 30 kV and below (PDF format, 403kBytes)\u003c\/a\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"Hitachi High-Tech","offers":[{"title":"Default Title","offer_id":54526103159107,"sku":null,"price":1.0,"currency_code":"SEK","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0629\/5794\/5072\/files\/SU9600_press_release.jpg?v=1780580553"}],"url":"https:\/\/spectral.se\/collections\/products.oembed","provider":"Spectral AB","version":"1.0","type":"link"}