Beginning of a new era ! : Spectral 3.0

From January 2018 Spectral has merged with Hitachi High-Technologies and has become Hitachi High-Technologies GmbH, Stockholm Filial.
All business relations, contracts and agreements have been taken over by the new company and will continue without interruption.
We are still the same people and have the same contact details as before, if you have questions just give us a call or send an email.

Our new corporate id number is 516410-7954 (VAT: SE516410795401) and our new address is :
Postal address : Box 3150, 169 03 Solna, Sweden
Visiting address : Frösundaviks Allé 15, 6tr, 169 70 Solna, Sweden

This will mean a tighter integration of Spectral within Hitachi:s European operations, but also a clear strategy from Hitachi to work closer with customers and to provide solutions not only in form of electron microscopes.

We will continue working closely with all our suppliers to provide value and good solutions in the area of electron microscopy and surface science.

Welcome to Spectral 3.0
Mats Eriksson
SU 5000
FE-SEM Flexibility
The SU5000 FE-SEM has forever changed SEM operations. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers a new level of SEM operation and control. Expert or novice, the result is now the same: Highest quality nano-scale images at everyone's fingertips!
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FlexSEM 1000
Big performance in a small format
The FlexSEM 1000 is a compact variable-pressure SEM that delivers the performance of a conventional SEM in a lab-friendly footprint, and requires only a standard wall outlet for power.
The FlexSEM will change your view of electron microscopy!
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Time for the next generation !
TM4000 and TM4000plus are based on the successful TM3000/TM3030 series but also has completely new electron optics and new software.
Now we also offer an optical image of the whole sample that is used for intuitive stage navigation.
The TM4000plus version also has an integrated SE detector that works in variable pressure, so you can take SE images of non-conductive samples.